Tadashi Kitamura

Person

Hiratsuka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Machining condition estimating apparatus and machining condition es...
- Patent number 9,459,614
- Issue date Oct 4, 2016
- Hitachi Metals, Ltd.
- Koji Utsumi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Pattern inspection apparatus and method
- Patent number 9,189,843
- Issue date Nov 17, 2015
- NGR Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect and critical dimension analysis systems and methods for a se...
- Patent number 8,422,761
- Issue date Apr 16, 2013
- NGR Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus and method
- Patent number 8,285,031
- Issue date Oct 9, 2012
- NGR Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for a semiconductor lithographic process control...
- Patent number 8,150,140
- Issue date Apr 3, 2012
- NGR Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus and method
- Patent number 8,045,785
- Issue date Oct 25, 2011
- NGR Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus and method
- Patent number 7,983,471
- Issue date Jul 19, 2011
- NGR Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for producing liquid crystal display cell and sealing agent...
- Patent number 7,903,230
- Issue date Mar 8, 2011
- Mitsui Chemicals, Inc.
- Tadashi Kitamura
- G02 - OPTICS
Information Patent Grant
Pattern inspection apparatus and method
- Patent number 7,817,844
- Issue date Oct 19, 2010
- Nanogeometry Research Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus and method
- Patent number 7,796,801
- Issue date Sep 14, 2010
- Nanogeometry Research Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus, pattern inspection method, and record...
- Patent number 7,660,455
- Issue date Feb 9, 2010
- Nanogeometry Research Inc.
- Masahiro Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Liquid crystal sealing agent composition and manufacturing method o...
- Patent number 7,566,377
- Issue date Jul 28, 2009
- Mitsui Chemicals, Inc.
- Takahisa Miyawaki
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Sealant material for plastic liquid crystal display cells including...
- Patent number 7,541,075
- Issue date Jun 2, 2009
- Mitsui Chemicals, Inc.
- Tadashi Kitamura
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Sealing material for plastic liquid crystal display cells including...
- Patent number 6,913,798
- Issue date Jul 5, 2005
- Mitsui Chemicals, Inc.
- Tadashi Kitamura
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Pattern inspection apparatus, pattern inspection method, and record...
- Patent number 6,868,175
- Issue date Mar 15, 2005
- Nanogeometry Research
- Masahiro Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Anisotropic conductive paste
- Patent number 6,812,065
- Issue date Nov 2, 2004
- Mitsui Chemicals, Inc.
- Tadashi Kitamura
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Sealing material composition for liquid crystal
- Patent number 6,555,187
- Issue date Apr 29, 2003
- Mitsui Chemicals, Inc.
- Tadashi Kitamura
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Scanning electronic microscope and method for automatically observi...
- Patent number 6,399,953
- Issue date Jun 4, 2002
- Seiko Instruments Inc.
- Tadashi Kitamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isocyanate resin compositions and hot melt and pressure sensitive a...
- Patent number 5,633,317
- Issue date May 27, 1997
- Mitsui Toatsu Chemicals, Inc.
- Eiichi Kawasaki
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Particle analysis method
- Patent number 5,477,049
- Issue date Dec 19, 1995
- Seiko Instruments Inc.
- Tadashi Kitamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of automatically setting coordinate conversion factor
- Patent number 5,444,245
- Issue date Aug 22, 1995
- Seiko Instruments Inc.
- Tadashi Kitamura
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Isocyanate resin compositions and hot melt and pressure sensitive a...
- Patent number 5,418,288
- Issue date May 23, 1995
- Mitsui Toatsu Chemicals, Inc.
- Eiichi Kawasaki
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Oiled-face adherable, hot-melt adhesive composition and a non-slip...
- Patent number 5,095,059
- Issue date Mar 10, 1992
- Mitsui Toatsu Chemicals, Inc.
- Tadashi Kitamura
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Composition for conductive cured product
- Patent number 4,387,115
- Issue date Jun 7, 1983
- Mitsui Toatsu Chemicals, Inc.
- Tadashi Kitamura
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Process for producing cured products
- Patent number 4,122,143
- Issue date Oct 24, 1978
- Mitsui Toatsu Chemicals, Inc.
- Yoshitaka Momotari
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...

Patents Applicationslast 30 patents

Information Patent Application
PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS
- Publication number 20170372464
- Publication date Dec 28, 2017
- NGR Inc.
- Tadashi KITAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Machining Condition Estimating Apparatus and Machining Condition Es...
- Publication number 20140200709
- Publication date Jul 17, 2014
- Hitachi Metals, Ltd.
- Koji UTSUMI
- G05 - CONTROLLING REGULATING
Information Patent Application
PATTERN INSPECTION APPARATUS AND METHOD
- Publication number 20120328181
- Publication date Dec 27, 2012
- NGR Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems And Methods For Inspecting And Controlling Integrated Circu...
- Publication number 20120117520
- Publication date May 10, 2012
- NGR, Inc.
- Tadashi Kitamura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PATTERN INSPECTION APPARATUS AND METHOD
- Publication number 20110235895
- Publication date Sep 29, 2011
- NGR INC.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND METHOD
- Publication number 20100303334
- Publication date Dec 2, 2010
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System And Method For A Semiconductor Lithographic Process Control...
- Publication number 20100215247
- Publication date Aug 26, 2010
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect And Critical Dimension Analysis Systems And Methods For A Se...
- Publication number 20100158345
- Publication date Jun 24, 2010
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspection apparatus and method
- Publication number 20080130982
- Publication date Jun 5, 2008
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for producing liquid crystal display cell and sealing agent...
- Publication number 20070179221
- Publication date Aug 2, 2007
- Mitsui Chemicals, Inc.
- Tadashi Kitamura
- G02 - OPTICS
Information Patent Application
Pattern inspection apparatus and method
- Publication number 20060245636
- Publication date Nov 2, 2006
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sealing composition for liquid crystal displays and process for pro...
- Publication number 20060009579
- Publication date Jan 12, 2006
- MITSUI CHEMICALS AND AND SHARP KABUSHIKI KAISHA
- Takahisa Miyawaki
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
Sealant material for plastic liquid crystal display cells including...
- Publication number 20050249891
- Publication date Nov 10, 2005
- Mitsui Chemicals Inc.
- Tadashi Kitamura
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
Pattern inspection apparatus, pattern inspection method, and record...
- Publication number 20050226494
- Publication date Oct 13, 2005
- Nanogeometry Research
- Masahiro Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspection apparatus and method
- Publication number 20050146714
- Publication date Jul 7, 2005
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for producing liquid crystal display cell and sealing agent...
- Publication number 20050143513
- Publication date Jun 30, 2005
- Mitsui Chemicals, Inc.
- Tadashi Kitamura
- G02 - OPTICS
Information Patent Application
Pattern inspection apparatus and method
- Publication number 20040081350
- Publication date Apr 29, 2004
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sealant for liquid crystal display cell, composition for liquid cry...
- Publication number 20040075802
- Publication date Apr 22, 2004
- Mitsui Chemicals, Inc.
- Tadashi Kitamura
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
Sealing material for plastic liquid crystal display cells
- Publication number 20020176046
- Publication date Nov 28, 2002
- Tadashi Kitamura
- G02 - OPTICS

Tadashi Kitamura

Person

Patents Grantslast 30 patents

Machining condition estimating apparatus and machining condition es...

Pattern inspection apparatus and method

Defect and critical dimension analysis systems and methods for a se...

Pattern inspection apparatus and method

System and method for a semiconductor lithographic process control...

Pattern inspection apparatus and method

Pattern inspection apparatus and method

Method for producing liquid crystal display cell and sealing agent...

Pattern inspection apparatus and method

Pattern inspection apparatus and method

Pattern inspection apparatus, pattern inspection method, and record...

Liquid crystal sealing agent composition and manufacturing method o...

Sealant material for plastic liquid crystal display cells including...

Sealing material for plastic liquid crystal display cells including...

Pattern inspection apparatus, pattern inspection method, and record...

Anisotropic conductive paste

Sealing material composition for liquid crystal

Scanning electronic microscope and method for automatically observi...

Isocyanate resin compositions and hot melt and pressure sensitive a...

Particle analysis method

Method of automatically setting coordinate conversion factor

Isocyanate resin compositions and hot melt and pressure sensitive a...

Oiled-face adherable, hot-melt adhesive composition and a non-slip...

Composition for conductive cured product

Process for producing cured products

Patents Applicationslast 30 patents

PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS

Machining Condition Estimating Apparatus and Machining Condition Es...

PATTERN INSPECTION APPARATUS AND METHOD

Systems And Methods For Inspecting And Controlling Integrated Circu...

PATTERN INSPECTION APPARATUS AND METHOD

PATTERN INSPECTION APPARATUS AND METHOD

System And Method For A Semiconductor Lithographic Process Control...

Defect And Critical Dimension Analysis Systems And Methods For A Se...

Pattern inspection apparatus and method

Method for producing liquid crystal display cell and sealing agent...

Pattern inspection apparatus and method

Sealing composition for liquid crystal displays and process for pro...

Sealant material for plastic liquid crystal display cells including...

Pattern inspection apparatus, pattern inspection method, and record...

Pattern inspection apparatus and method

Method for producing liquid crystal display cell and sealing agent...

Pattern inspection apparatus and method

Sealant for liquid crystal display cell, composition for liquid cry...

Sealing material for plastic liquid crystal display cells