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Tadashi Matsushita
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Ibaraki, JP
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last 30 patents
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Patent Grant
Method and apparatus for measuring scattering intensity distribution
Patent number
9,714,907
Issue date
Jul 25, 2017
Inter-University Research Institute Corporation High Energy Accelerator Resea...
Tadashi Matsushita
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Patents Applications
last 30 patents
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Patent Application
METHOD AND APPARATUS FOR MEASURING SCATTERING INTENSITY DISTRIBUTION
Publication number
20160069825
Publication date
Mar 10, 2016
INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION HIGH ENERGY ACCELERATOR RESEA...
Tadashi Matsushita
G01 - MEASURING TESTING