Tadashi Nakamura

Person

Nishiwaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Contact probe and probe device
- Patent number 7,015,710
- Issue date Mar 21, 2006
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and probe device
- Patent number 6,937,042
- Issue date Aug 30, 2005
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and probe device
- Patent number 6,919,732
- Issue date Jul 19, 2005
- Genesis Technology Incorporation
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and probe device
- Patent number 6,917,211
- Issue date Jul 12, 2005
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and probe device
- Patent number 6,903,563
- Issue date Jun 7, 2005
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and probe device
- Patent number 6,900,647
- Issue date May 31, 2005
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and probe device
- Patent number 6,710,608
- Issue date Mar 23, 2004
- Mitsubishi Materials Corporation
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Process for producing a highly crystalline, fine .alpha.-alumina po...
- Patent number 5,432,137
- Issue date Jul 11, 1995
- Mitsubishi Materials Corporation
- Akira Nishihara
- C01 - INORGANIC CHEMISTRY

Patents Applicationslast 30 patents

Information Patent Application
Contact probe and probe device
- Publication number 20050007130
- Publication date Jan 13, 2005
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Application
Contact probe and probe device
- Publication number 20050001642
- Publication date Jan 6, 2005
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Application
Contact probe and probe device
- Publication number 20050001641
- Publication date Jan 6, 2005
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Application
Contact probe and probe device
- Publication number 20050001643
- Publication date Jan 6, 2005
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Application
Contact probe and probe device
- Publication number 20050001644
- Publication date Jan 6, 2005
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Application
Contact probe and probe device
- Publication number 20040160236
- Publication date Aug 19, 2004
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Application
Contact probe and probe device
- Publication number 20020186030
- Publication date Dec 12, 2002
- MITSUBISHI MATERIALS CORPORATION
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR TESTING LIQUID CRYSTAL DISPLAY AND LIQUID CRYSTAL...
- Publication number 20010040451
- Publication date Nov 15, 2001
- HIDEAKI YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND PROBE DEVICE
- Publication number 20010019276
- Publication date Sep 6, 2001
- HIDEAKI YOSHIDA
- G01 - MEASURING TESTING

Tadashi Nakamura

Person

Patents Grantslast 30 patents

Contact probe and probe device

Contact probe and probe device

Contact probe and probe device

Contact probe and probe device

Contact probe and probe device

Contact probe and probe device

Contact probe and probe device

Process for producing a highly crystalline, fine .alpha.-alumina po...

Patents Applicationslast 30 patents

Contact probe and probe device

Contact probe and probe device

Contact probe and probe device

Contact probe and probe device

Contact probe and probe device

Contact probe and probe device

Contact probe and probe device

CONTACT PROBE FOR TESTING LIQUID CRYSTAL DISPLAY AND LIQUID CRYSTAL...

CONTACT PROBE AND PROBE DEVICE