Tadashi Nishioka

Person

Itami City, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of removing photosensitive resin and photosensitive resin re...
- Patent number 5,792,314
- Issue date Aug 11, 1998
- Ryoden Semiconductor System Engineering Corporation
- Hiroyuki Shima
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Contamination evaluating apparatus
- Patent number 5,736,745
- Issue date Apr 7, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Makiko Nagashima
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus for analyzing thin film property
- Patent number 5,723,982
- Issue date Mar 3, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Takao Yasue
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Photoresist coating apparatus
- Patent number 5,720,814
- Issue date Feb 24, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Motoshi Takagi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of forming fine patterns
- Patent number 5,710,066
- Issue date Jan 20, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Chikayuki Okamoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask for transferring a pattern for use in a semiconductor device a...
- Patent number 5,702,849
- Issue date Dec 30, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Hirofumi Sakata
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of forming fine patterns
- Patent number 5,688,723
- Issue date Nov 18, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Chikayuki Okamoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Atomic force microscope and measuring head thereof with linearly po...
- Patent number 5,656,809
- Issue date Aug 12, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Norihisa Miyashita
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of using scanning probe microscope allowing cleaning of prob...
- Patent number 5,652,428
- Issue date Jul 29, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Mask for transferring a pattern for use in a semiconductor device a...
- Patent number 5,622,787
- Issue date Apr 22, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Hirofumi Sakata
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of forming fine patterns
- Patent number 5,595,941
- Issue date Jan 21, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Chikayuki Okamoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Sample stage for scanning probe microscope head
- Patent number 5,530,253
- Issue date Jun 25, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Adhesion measuring method
- Patent number 5,477,732
- Issue date Dec 26, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Takao Yasue
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever for atomic force microscope and method of manufacturing...
- Patent number 5,469,733
- Issue date Nov 28, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Takao Yasue
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor wafer inspection apparatus
- Patent number 5,465,145
- Issue date Nov 7, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Yukiko Nakashige
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever for use in atomic force microscope and manufacturing met...
- Patent number 5,193,385
- Issue date Mar 16, 1993
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for manufacturing a read only memory device using a focused...
- Patent number 5,130,273
- Issue date Jul 14, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Yoji Mashiko
- G11 - INFORMATION STORAGE
Information Patent Grant
Fine scanning mechanism for atomic force microscope
- Patent number 5,107,114
- Issue date Apr 21, 1992
- Mitsubish Denki Kabushiki Kaisha
- Tadashi Nishioka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Process for forming electrodes for semiconductor devices by focused...
- Patent number 5,043,290
- Issue date Aug 27, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Read only memory device including a superconductive electrode
- Patent number 4,990,489
- Issue date Feb 5, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Yoji Mashiko
- G11 - INFORMATION STORAGE
Information Patent Grant
Process for forming electrodes for semiconductor devices using focu...
- Patent number 4,962,059
- Issue date Oct 9, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for repairing a pattern
- Patent number 4,952,421
- Issue date Aug 28, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Hiroaki Morimoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Process for forming electrodes for semiconductor devices
- Patent number 4,948,749
- Issue date Aug 14, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tunnel unit and scanning head for scanning tunneling microscope
- Patent number 4,947,042
- Issue date Aug 7, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fine adjustment mechanism for a scanning tunneling microscope
- Patent number 4,945,235
- Issue date Jul 31, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fine adjustment mechanism for a scanning tunneling microscope
- Patent number 4,880,975
- Issue date Nov 14, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Process for forming electrodes for semiconductor devices using focu...
- Patent number 4,853,341
- Issue date Aug 1, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for identifying a blistered film in layered films
- Patent number 4,843,238
- Issue date Jun 27, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- G01 - MEASURING TESTING
Information Patent Grant
Coarse adjusting device of scanning tunneling microscope
- Patent number 4,837,445
- Issue date Jun 6, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Aluminum circuit to be disconnected and method of cutting the same
- Patent number 4,723,062
- Issue date Feb 2, 1988
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Tadashi Nishioka

Person

Patents Grantslast 30 patents

Method of removing photosensitive resin and photosensitive resin re...

Contamination evaluating apparatus

Apparatus for analyzing thin film property

Photoresist coating apparatus

Method of forming fine patterns

Mask for transferring a pattern for use in a semiconductor device a...

Method of forming fine patterns

Atomic force microscope and measuring head thereof with linearly po...

Method of using scanning probe microscope allowing cleaning of prob...

Mask for transferring a pattern for use in a semiconductor device a...

Method of forming fine patterns

Sample stage for scanning probe microscope head

Adhesion measuring method

Cantilever for atomic force microscope and method of manufacturing...

Semiconductor wafer inspection apparatus

Cantilever for use in atomic force microscope and manufacturing met...

Method for manufacturing a read only memory device using a focused...

Fine scanning mechanism for atomic force microscope

Process for forming electrodes for semiconductor devices by focused...

Read only memory device including a superconductive electrode

Process for forming electrodes for semiconductor devices using focu...

Method for repairing a pattern

Process for forming electrodes for semiconductor devices

Tunnel unit and scanning head for scanning tunneling microscope

Fine adjustment mechanism for a scanning tunneling microscope

Fine adjustment mechanism for a scanning tunneling microscope

Process for forming electrodes for semiconductor devices using focu...

Method for identifying a blistered film in layered films

Coarse adjusting device of scanning tunneling microscope

Aluminum circuit to be disconnected and method of cutting the same