Tadashi Obikane

Person

Nirasaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Test device, change kit, and method of exchanging change kit
- Patent number 12,106,997
- Issue date Oct 1, 2024
- Tokyo Electron Limited
- Hiroki Hosaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transfer and inspection devices of object to be inspected
- Patent number 8,905,700
- Issue date Dec 9, 2014
- Tokyo Electron Limited
- Tadashi Obikane
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Probe apparatus and substrate transfer method
- Patent number 8,726,748
- Issue date May 20, 2014
- Tokyo Electron Limited
- Tadashi Obikane
- G01 - MEASURING TESTING
Information Patent Grant
Probing apparatus and probing method
- Patent number 8,310,261
- Issue date Nov 13, 2012
- Tokyo Electron Limited
- Hiroki Hosaka
- G01 - MEASURING TESTING
Information Patent Grant
FOUP opening/closing device and probe apparatus
- Patent number 8,267,633
- Issue date Sep 18, 2012
- Tokyo Electron Limited
- Tadashi Obikane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Processing apparatus
- Patent number 7,887,280
- Issue date Feb 15, 2011
- Tokyo Electron Limited
- Hiroki Hosaka
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Probe apparatus
- Patent number 7,741,837
- Issue date Jun 22, 2010
- Tokyo Electron Limited
- Tadashi Obikane
- G01 - MEASURING TESTING
Information Patent Grant
Each inspection units of a probe apparatus is provided with an imag...
- Patent number 7,701,236
- Issue date Apr 20, 2010
- Tokyo Electron Limited
- Shuji Akiyama
- G01 - MEASURING TESTING
Information Patent Grant
Wafer carrying-in/out apparatus
- Patent number D607424
- Issue date Jan 5, 2010
- Tokyo Electron Limited
- Hiroki Hosaka
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Wafer carrying-in/out apparatus
- Patent number D602882
- Issue date Oct 27, 2009
- Tokyo Electron Limited
- Hiroki Hosaka
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Probing apparatus and probing method
- Patent number 7,583,096
- Issue date Sep 1, 2009
- Tokyo Electron Limited
- Hiroki Hosaka
- G01 - MEASURING TESTING
Information Patent Grant
Wafer carrying-in/out machine
- Patent number D592230
- Issue date May 12, 2009
- Tokyo Electron Limited
- Hiroki Hosaka
- D15 - Machines not elsewhere specified
Information Patent Grant
Load port capable of coping with different types of cassette contai...
- Patent number 6,830,651
- Issue date Dec 14, 2004
- Tokyo Electron Limited
- Tadashi Obikane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probing apparatus and head plate opening/closing force-reducing mec...
- Patent number 6,441,630
- Issue date Aug 27, 2002
- Tokyo Electron Limited
- Tadashi Obikane
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer probing apparatus
- Patent number 5,828,225
- Issue date Oct 27, 1998
- Tokyo Electron Limited
- Tadashi Obikane
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus
- Patent number 5,086,270
- Issue date Feb 4, 1992
- Tokyo Electron Limited
- Wataru Karasawa
- G01 - MEASURING TESTING
Information Patent Grant
Electric probing test machine
- Patent number 4,950,982
- Issue date Aug 21, 1990
- Tokyo Electron Limited
- Tadashi Obikane
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROCESSING APPARATUS AND SUBSTRATE TRANSFER METHOD
- Publication number 20240178034
- Publication date May 30, 2024
- TOKYO ELECTRON LIMITED
- Tadashi OBIKANE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE DELIVERY METHOD AND SUBSTRATE DELIVERY DEVICE
- Publication number 20220172964
- Publication date Jun 2, 2022
- TOKYO ELECTRON LIMITED
- Tadashi OBIKANE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST DEVICE, CHANGE KIT, AND METHOD OF EXCHANGING CHANGE KIT
- Publication number 20220172978
- Publication date Jun 2, 2022
- TOKYO ELECTRON LIMITED
- Hiroki HOSAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSFER DEVICE, TRANSFER METHOD, AND INSPECTION SYSTEM
- Publication number 20190189482
- Publication date Jun 20, 2019
- TOKYO ELECTRON LIMITED
- Tadashi OBIKANE
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
PROBE APPARATUS AND SUBSTRATE TRANSFER METHOD
- Publication number 20110107858
- Publication date May 12, 2011
- TOKYO ELECTRON LIMITED
- Tadashi Obikane
- G01 - MEASURING TESTING
Information Patent Application
FOUP OPENING/CLOSING DEVICE AND PROBE APPARATUS
- Publication number 20100040441
- Publication date Feb 18, 2010
- TOKYO ELECTRON LIMITED
- Tadashi OBIKANE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBING APPARATUS AND PROBING METHOD
- Publication number 20090267626
- Publication date Oct 29, 2009
- TOKYO ELECTRON LIMITED
- Hiroki HOSAKA
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS
- Publication number 20080290886
- Publication date Nov 27, 2008
- TOKYO ELECTRON LIMITED
- Shuji Akiyama
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS
- Publication number 20080284455
- Publication date Nov 20, 2008
- TOKYO ELECTRON LIMITED
- Tadashi OBIKANE
- G01 - MEASURING TESTING
Information Patent Application
TRANSFER AND INSPECTION DEVICES OF OBJECT TO BE INSPECTED
- Publication number 20080240891
- Publication date Oct 2, 2008
- TOKYO ELECTRON LIMITED
- Tadashi Obikane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESSING APPARATUS
- Publication number 20070264104
- Publication date Nov 15, 2007
- TOKYO ELECTRON LIMITED
- Hiroki HOSAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBING APPARATUS AND PROBING METHOD
- Publication number 20070262783
- Publication date Nov 15, 2007
- TOKYO ELECTRON LIMITED
- Hiroki HOSAKA
- G01 - MEASURING TESTING
Information Patent Application
Load port capable of coping with different types of cassette contai...
- Publication number 20040040661
- Publication date Mar 4, 2004
- Tadashi Obikane
- H01 - BASIC ELECTRIC ELEMENTS

Tadashi Obikane

Person

Patents Grantslast 30 patents

Test device, change kit, and method of exchanging change kit

Transfer and inspection devices of object to be inspected

Probe apparatus and substrate transfer method

Probing apparatus and probing method

FOUP opening/closing device and probe apparatus

Processing apparatus

Probe apparatus

Each inspection units of a probe apparatus is provided with an imag...

Wafer carrying-in/out apparatus

Wafer carrying-in/out apparatus

Probing apparatus and probing method

Wafer carrying-in/out machine

Load port capable of coping with different types of cassette contai...

Probing apparatus and head plate opening/closing force-reducing mec...

Semiconductor wafer probing apparatus

Probe apparatus

Electric probing test machine

Patents Applicationslast 30 patents

PROCESSING APPARATUS AND SUBSTRATE TRANSFER METHOD

SUBSTRATE DELIVERY METHOD AND SUBSTRATE DELIVERY DEVICE

TEST DEVICE, CHANGE KIT, AND METHOD OF EXCHANGING CHANGE KIT

TRANSFER DEVICE, TRANSFER METHOD, AND INSPECTION SYSTEM

PROBE APPARATUS AND SUBSTRATE TRANSFER METHOD

FOUP OPENING/CLOSING DEVICE AND PROBE APPARATUS

PROBING APPARATUS AND PROBING METHOD

PROBE APPARATUS

PROBE APPARATUS

TRANSFER AND INSPECTION DEVICES OF OBJECT TO BE INSPECTED

PROCESSING APPARATUS

PROBING APPARATUS AND PROBING METHOD

Load port capable of coping with different types of cassette contai...