Tadashi Ohachi

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Atomic flux measurement device
- Patent number 9,658,191
- Issue date May 23, 2017
- The Doshisha
- Tadashi Ohachi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Semiconductor device having a group-III nitride superlattice layer...
- Patent number 8,222,674
- Issue date Jul 17, 2012
- Showa Denko K.K.
- Tadashi Ohachi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of manufacturing a semiconductor device having a group-III n...
- Patent number 8,043,977
- Issue date Oct 25, 2011
- Showa Denko K.K.
- Tadashi Ohachi
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
ATOMIC FLUX MEASUREMENT DEVICE
- Publication number 20130124124
- Publication date May 16, 2013
- ARIOS INC.
- Tadashi OHACHI
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE HAVING A GROUP-III N...
- Publication number 20120007050
- Publication date Jan 12, 2012
- THE DOSHISHA
- Tadashi OHACHI
- C30 - CRYSTAL GROWTH
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20090127583
- Publication date May 21, 2009
- Showa Denko K.K.
- Tadashi Ohachi
- C30 - CRYSTAL GROWTH