Tadashi Tanimoto

Person

Otsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of fabricating a semiconductor device and a method of genera...
- Patent number 7,707,523
- Issue date Apr 27, 2010
- Panasonic Corporation
- Kiyohito Mukai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask pattern generating method and mask pattern generating apparatus
- Patent number 7,337,423
- Issue date Feb 26, 2008
- Matsushita Electric Industrial Co., Ltd.
- Minoru Yamagiwa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of fabricating a semiconductor device and a method of genera...
- Patent number 7,115,478
- Issue date Oct 3, 2006
- Matsushita Electric Industrial Co., Ltd.
- Kiyohito Mukai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask pattern inspecting method, inspection apparatus, inspecting da...
- Patent number 7,114,144
- Issue date Sep 26, 2006
- Matsushita Electric Industrial Co., Ltd.
- Shinya Tokunaga
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device manufacturing method, library used for the sam...
- Publication number 20070174807
- Publication date Jul 26, 2007
- Masahiko Kumashiro
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MOS transistor cell and semiconductor device
- Publication number 20070051995
- Publication date Mar 8, 2007
- Masahiko Kumashiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of fabricating a semiconductor device and a method of genera...
- Publication number 20070020880
- Publication date Jan 25, 2007
- Matsushita Electric Industrial Co., Ltd.
- Kiyohito Mukai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mask pattern inspecting method, inspection apparatus, inspecting da...
- Publication number 20070009147
- Publication date Jan 11, 2007
- Matsushita Electric Industrial Co., Ltd.
- Shinya Tokunaga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor design layout pattern formation method and graphic pa...
- Publication number 20040243967
- Publication date Dec 2, 2004
- Matsushita Electric Industrial Co., Ltd.
- Minoru Yamagiwa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mask pattern generating method and mask pattern generating apparatus
- Publication number 20040191644
- Publication date Sep 30, 2004
- Matsushita Electric Industrial Co., Ltd.
- Minoru Yamagiwa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Mask pattern inspecting method, inspection apparatus, inspecting da...
- Publication number 20040148584
- Publication date Jul 29, 2004
- Shinya Tokunaga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of fabricating a semiconductor device and a method of genera...
- Publication number 20040083445
- Publication date Apr 29, 2004
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Kiyohito Mukai
- G06 - COMPUTING CALCULATING COUNTING

Tadashi Tanimoto

Person

Patents Grantslast 30 patents

Method of fabricating a semiconductor device and a method of genera...

Mask pattern generating method and mask pattern generating apparatus

Method of fabricating a semiconductor device and a method of genera...

Mask pattern inspecting method, inspection apparatus, inspecting da...

Patents Applicationslast 30 patents

Semiconductor device manufacturing method, library used for the sam...

MOS transistor cell and semiconductor device

Method of fabricating a semiconductor device and a method of genera...

Mask pattern inspecting method, inspection apparatus, inspecting da...

Semiconductor design layout pattern formation method and graphic pa...

Mask pattern generating method and mask pattern generating apparatus

Mask pattern inspecting method, inspection apparatus, inspecting da...

Method of fabricating a semiconductor device and a method of genera...