Tadashi UTAKA

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Takatsuki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray fluorescence spectrometer and X-ray fluorescence analyzer
- Patent number 9,448,191
- Issue date Sep 20, 2016
- Techno-X Co., Ltd.
- Tadashi Utaka
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analyzing apparatus
- Patent number 5,732,120
- Issue date Mar 24, 1998
- Rigaku Industrial Corporation
- Takashi Shoji
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectroscopic analyzing apparatus
- Patent number 5,132,997
- Issue date Jul 21, 1992
- Rigaku Industrial Corporation
- Shinjiro Kojima
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectroscope
- Patent number 4,271,353
- Issue date Jun 2, 1981
- Rigaku Industrial Corporation
- Nobuo Ohtsuki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectroscope
- Patent number 4,256,961
- Issue date Mar 17, 1981
- Rigaku Industrial Corporation
- Takashi Shoji
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-Ray Fluorescence Spectrometer and X-Ray Fluorescence Analyzer
- Publication number 20130170613
- Publication date Jul 4, 2013
- Tadashi UTAKA
- G01 - MEASURING TESTING