Los Angeles, CA, US
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Patent Grant
The Regents of the University of California
Jacob J. Schmidt
B82 - NANO-TECHNOLOGY
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Patent Grant
The Regents of the University of California
Jacob J. Schmidt
G01 - MEASURING TESTING
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Patent Application
Jacob J. Schmidt
G01 - MEASURING TESTING
Information
Patent Application
Jacob J. Schmidt
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
Jacob J. Schmidt
G01 - MEASURING TESTING
