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Tae W. Hahn
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North Hollywood, CA, US
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last 30 patents
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Patent Grant
Means and method for active dispersion equalization of a multioscil...
Patent number
5,786,895
Issue date
Jul 28, 1998
Litton Systems, Inc.
Robert A. Mitchell
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for detecting rotation rate, Faraday bias and...
Patent number
5,751,425
Issue date
May 12, 1998
Litton Systems, Inc.
Donald A. Frederick
G01 - MEASURING TESTING
Information
Patent Grant
Radio frequency excited ring laser gyro
Patent number
5,442,441
Issue date
Aug 15, 1995
Litton Systems, Inc.
Bruce C. Grover
G01 - MEASURING TESTING
Information
Patent Grant
Active magnetic field tuning for dispersion equalization of a multi...
Patent number
5,374,990
Issue date
Dec 20, 1994
Litton Systems, Inc.
Tae W. Hahn
G01 - MEASURING TESTING
Information
Patent Grant
Radio frequency excited ring laser gyroscope with common induction...
Patent number
5,305,085
Issue date
Apr 19, 1994
Litton Systems, Inc.
Tae W. Hahn
G01 - MEASURING TESTING
Information
Patent Grant
Multioscillator ring laser gyroscope adaptive digitally controlled...
Patent number
5,208,653
Issue date
May 4, 1993
Litton Systems, Inc.
John G. Mark
G01 - MEASURING TESTING
Information
Patent Grant
Radio frequency excited ring laser gyroscope
Patent number
5,196,905
Issue date
Mar 23, 1993
Litton Systems, Inc.
Tae W. Hahn
G01 - MEASURING TESTING
Information
Patent Grant
Multioscillator ring laser gyroscope local oscillator-based output...
Patent number
5,189,487
Issue date
Feb 23, 1993
Litton Systems, Inc.
John G. Mark
G01 - MEASURING TESTING
Information
Patent Grant
Split-gain multimode ring laser gyroscope output optics detection s...
Patent number
5,157,462
Issue date
Oct 20, 1992
Litton Systems, Inc.
Tae Hahn
G01 - MEASURING TESTING
Information
Patent Grant
Cavity length control apparatus for a multi-oscillator
Patent number
4,963,026
Issue date
Oct 16, 1990
Litton Systems, Inc.
Tae W. Hahn
G01 - MEASURING TESTING