Tae-Yeol Heo

Follow

Person

Kyeongki-do, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor wafers having asymmetric edge profiles that facilitat...
- Patent number 7,258,931
- Issue date Aug 21, 2007
- Samsung Electronics Co., Ltd.
- Gi-Jung Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for analyzing a substrate employing a copper decoration
- Patent number 6,919,214
- Issue date Jul 19, 2005
- Samsung Electronics Co., Ltd.
- Gi-Jung Kim
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for measuring microroughness of a substrate com...
- Patent number 6,552,337
- Issue date Apr 22, 2003
- Samsung Electronics Co., Ltd.
- Kyoo-chul Cho
- G01 - MEASURING TESTING
Information Patent Grant
Method of analyzing morphology of bulk defect and surface defect on...
- Patent number 6,252,228
- Issue date Jun 26, 2001
- Samsung Electronics Co., Ltd.
- Sung-hoon Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Slurry compositions for polishing wafers used in integrated circuit...
- Patent number 5,972,863
- Issue date Oct 26, 1999
- Samsung Electronics Co., Ltd.
- Tae-yeol Heo
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...

Patents Applicationslast 30 patents

Information Patent Application
Susceptor and deposition apparatus including the same
- Publication number 20050016470
- Publication date Jan 27, 2005
- Tae-Soo Kang
- C30 - CRYSTAL GROWTH
Information Patent Application
Apparatus for analyzing a substrate employing a copper decoration
- Publication number 20040112742
- Publication date Jun 17, 2004
- Gi-Jung Kim
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wafers having asymmetric edge profiles that facilitat...
- Publication number 20040041143
- Publication date Mar 4, 2004
- Gi-Jung Kim
- H01 - BASIC ELECTRIC ELEMENTS