Taeg Gyum KIM

Person

  • Gyunggi-do, KR

Patents Grantslast 30 patents

  • Information Patent Grant

    Apparatus for detecting particle

    • Patent number 8,228,503
    • Issue date Jul 24, 2012
    • Samsung Electro-Mechanics Co., Ltd.
    • Taeg-Gyum Kim
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    THREE-DIMENSIONAL MEASURING DEVICE AND METHOD

    • Publication number 20130235387
    • Publication date Sep 12, 2013
    • Samsung Electro-Mechanics Co., Ltd.
    • Taeg Gyum Kim
    • G01 - MEASURING TESTING
  • Information Patent Application

    LASER SCANNING DEVICE AND LASER SCANNING METHOD

    • Publication number 20130215917
    • Publication date Aug 22, 2013
    • Samsung Electro-Mechanics Co., Ltd.
    • Taeg Gyum Kim
    • G02 - OPTICS
  • Information Patent Application

    LASER SCAN DEVICE

    • Publication number 20130208277
    • Publication date Aug 15, 2013
    • SAMSUNG ELECTRO-MECHANICS CO., LTD.
    • Taeg Gyum KIM
    • G01 - MEASURING TESTING
  • Information Patent Application

    Apparatus for inspecting printed circuit board

    • Publication number 20120194810
    • Publication date Aug 2, 2012
    • Samsung Electro-Mechanics Co., Ltd.
    • Taeg Gyum Kim
    • G01 - MEASURING TESTING
  • Information Patent Application

    APPARATUS FOR DETECTING PARTICLE

    • Publication number 20110242534
    • Publication date Oct 6, 2011
    • Samsung Electro-Mechanics CO., LTD.
    • Taeg-Gyum KIM
    • G01 - MEASURING TESTING