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Taeg Gyum KIM
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Gyunggi-do, KR
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Patents Grants
last 30 patents
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Patent Grant
Apparatus for detecting particle
Patent number
8,228,503
Issue date
Jul 24, 2012
Samsung Electro-Mechanics Co., Ltd.
Taeg-Gyum Kim
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
THREE-DIMENSIONAL MEASURING DEVICE AND METHOD
Publication number
20130235387
Publication date
Sep 12, 2013
Samsung Electro-Mechanics Co., Ltd.
Taeg Gyum Kim
G01 - MEASURING TESTING
Information
Patent Application
LASER SCANNING DEVICE AND LASER SCANNING METHOD
Publication number
20130215917
Publication date
Aug 22, 2013
Samsung Electro-Mechanics Co., Ltd.
Taeg Gyum Kim
G02 - OPTICS
Information
Patent Application
LASER SCAN DEVICE
Publication number
20130208277
Publication date
Aug 15, 2013
SAMSUNG ELECTRO-MECHANICS CO., LTD.
Taeg Gyum KIM
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for inspecting printed circuit board
Publication number
20120194810
Publication date
Aug 2, 2012
Samsung Electro-Mechanics Co., Ltd.
Taeg Gyum Kim
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR DETECTING PARTICLE
Publication number
20110242534
Publication date
Oct 6, 2011
Samsung Electro-Mechanics CO., LTD.
Taeg-Gyum KIM
G01 - MEASURING TESTING