TREA

Taeheung AHN

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  • Seoul, KR
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Patents Grantslast 30 patents

  • Information Patent Grant

    Wafer inspection apparatuses
    • Patent number 11,688,623
    • Issue date Jun 27, 2023
    • Samsung Electronics Co., Ltd.
    • Racine Elysia Auxter Nassau
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    INSPECTION APPARATUS OF WAFER
    • Publication number 20210366102
    • Publication date Nov 25, 2021
    • Samsung Electronics Co., Ltd.
    • Suhwan PARK
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    WAFER INSPECTION APPARATUSES
    • Publication number 20210057262
    • Publication date Feb 25, 2021
    • Samsung Electronics Co., Ltd.
    • Racine Elysia Auxter NASSAU
    • H01 - BASIC ELECTRIC ELEMENTS