TAEHYOUNG LEE

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Suwon-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope device, semiconductor manufacturing de...
- Patent number 12,307,650
- Issue date May 20, 2025
- Samsung Electronics Co., Ltd.
- Yunje Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for virtually executing an operation of an energy...
- Patent number 11,639,906
- Issue date May 2, 2023
- Samsung Electronics Co., Ltd.
- Shashank Shrikant Agashe
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a semiconductor processing chamber using a vis...
- Patent number 11,538,701
- Issue date Dec 27, 2022
- Samsung Electronics Co., Ltd.
- Taehyoung Lee
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNING ELECTRON MICROSCOPE DEVICE, SEMICONDUCTOR MANUFACTURING DE...
- Publication number 20230074302
- Publication date Mar 9, 2023
- Samsung Electronics Co., Ltd.
- Yunje CHO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR VIRTUALLY EXECUTING AN OPERATION OF AN ENERGY...
- Publication number 20220163467
- Publication date May 26, 2022
- Samsung Electronics Co., Ltd.
- Shashank Shrikant AGASHE
- G01 - MEASURING TESTING
Information Patent Application
Method of inspecting a semiconductor processing chamber using a vis...
- Publication number 20210013074
- Publication date Jan 14, 2021
- Samsung Electronics Co., Ltd.
- TAEHYOUNG LEE
- G06 - COMPUTING CALCULATING COUNTING