TAEJOONG KIM

Person

SUJI-GU, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Thickness estimation method and processing control method
- Patent number 11,668,558
- Issue date Jun 6, 2023
- Samsung Electronics Co., Ltd.
- Jongsu Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer inspection apparatus and method
- Patent number 11,579,096
- Issue date Feb 14, 2023
- Samsung Electronics Co., Ltd.
- Sungha Kim
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection apparatus, a method of inspecting a substrate, a...
- Patent number 9,915,623
- Issue date Mar 13, 2018
- Samsung Electronics Co., Ltd.
- Kwang Soo Kim
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
PUPIL IMAGE MEASURING DEVICE AND METHOD
- Publication number 20240167806
- Publication date May 23, 2024
- Samsung Electronics Co., Ltd.
- Seungwoo LEE
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROCESSING APPARATUS
- Publication number 20230207356
- Publication date Jun 29, 2023
- Samsung Electronics Co., Ltd.
- Seungbeom PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EUV PHOTOMASK INSPECTION APPARATUS
- Publication number 20230194845
- Publication date Jun 22, 2023
- Samsung Electronics Co., Ltd.
- Garam Choi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
THICKNESS ESTIMATION METHOD AND PROCESSING CONTROL METHOD
- Publication number 20220065618
- Publication date Mar 3, 2022
- Samsung Electronics Co., Ltd.
- Jongsu Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER INSPECTION APPARATUS AND METHOD
- Publication number 20210341396
- Publication date Nov 4, 2021
- Samsung Electronics Co., Ltd.
- Sungha KIM
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION SYSTEM
- Publication number 20180164227
- Publication date Jun 14, 2018
- Samsung Electronics Co., Ltd.
- Taejoong KIM
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION APPARATUS, A METHOD OF INSPECTING A SUBSTRATE, A...
- Publication number 20170082552
- Publication date Mar 23, 2017
- Samsung Electronics Co., Ltd.
- Kwang Soo Kim
- G02 - OPTICS
Information Patent Application
SURFACE LIGHT SOURCE USING ARRAYED POINT LIGHT SOURCES
- Publication number 20150308654
- Publication date Oct 29, 2015
- Samsung Electronics Co., Ltd.
- YOUNGKYU PARK
- F21 - LIGHTING

TAEJOONG KIM

Person

Patents Grantslast 30 patents

Thickness estimation method and processing control method

Wafer inspection apparatus and method

Optical inspection apparatus, a method of inspecting a substrate, a...

Patents Applicationslast 30 patents

PUPIL IMAGE MEASURING DEVICE AND METHOD

WAFER PROCESSING APPARATUS

EUV PHOTOMASK INSPECTION APPARATUS

THICKNESS ESTIMATION METHOD AND PROCESSING CONTROL METHOD

WAFER INSPECTION APPARATUS AND METHOD

SUBSTRATE INSPECTION SYSTEM

OPTICAL INSPECTION APPARATUS, A METHOD OF INSPECTING A SUBSTRATE, A...

SURFACE LIGHT SOURCE USING ARRAYED POINT LIGHT SOURCES