Membership
Tour
Register
Log in
Taekyeong KIM
Follow
Person
Pyeongtaek-si, KR
People
Overview
Industries
Organizations
People
Information
Impact
Patents Applications
last 30 patents
Information
Patent Application
PROBES FOR SCANNING PROBE MICROSCOPY
Publication number
20100032719
Publication date
Feb 11, 2010
Seunghun HONG
G01 - MEASURING TESTING