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Taeyoon JEON
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Pasadena, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Compact hyperspectral mid-infrared spectrometer
Patent number
11,629,996
Issue date
Apr 18, 2023
California Institute of Technology
Axel Scherer
G01 - MEASURING TESTING
Information
Patent Grant
System for analyzing a test sample and method therefor
Patent number
11,619,577
Issue date
Apr 4, 2023
California Institute of Technology
Axel Scherer
G01 - MEASURING TESTING
Information
Patent Grant
Cuvette having high optical transmissivity and method of forming
Patent number
11,442,002
Issue date
Sep 13, 2022
California Institute of Technology
Axel Scherer
G01 - MEASURING TESTING
Information
Patent Grant
System for analyzing a test sample and method therefor
Patent number
11,422,084
Issue date
Aug 23, 2022
California Institute of Technology
Axel Scherer
G01 - MEASURING TESTING
Information
Patent Grant
Infrared spectrometer having dielectric-polymer-based spectral filter
Patent number
11,313,722
Issue date
Apr 26, 2022
California Institute of Technology
Axel Scherer
G01 - MEASURING TESTING
Information
Patent Grant
Compact hyperspectral mid-infrared spectrometer
Patent number
11,287,322
Issue date
Mar 29, 2022
California Institute of Technology
Axel Scherer
G01 - MEASURING TESTING
Information
Patent Grant
Cuvette having high optical transmissivity and method of forming
Patent number
10,712,258
Issue date
Jul 14, 2020
California Institute of Technology
Axel Scherer
G01 - MEASURING TESTING
Information
Patent Grant
Spectral filter having controllable spectral bandwidth and resolution
Patent number
10,488,256
Issue date
Nov 26, 2019
California Institute of Technology
Axel Scherer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Thin-film Structures for Optical Applications Comprising Fluoride M...
Publication number
20230258848
Publication date
Aug 17, 2023
California Institute of Technology
Taeyoon JEON
G02 - OPTICS
Information
Patent Application
System for Optically Analyzing a Test Sample and Method Therefor
Publication number
20230152211
Publication date
May 18, 2023
California Institute of Technology
Jack Jewell
G01 - MEASURING TESTING
Information
Patent Application
System for Analyzing a Test Sample and Method Therefor
Publication number
20220349811
Publication date
Nov 3, 2022
California Institute of Technology
Axel Scherer
G01 - MEASURING TESTING
Information
Patent Application
Compact Hyperspectral Mid-Infrared Spectrometer
Publication number
20220170793
Publication date
Jun 2, 2022
California Institute of Technology
Axel SCHERER
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Optical Layer Having A Low Refractive Index and Methods of Fabrication
Publication number
20210373208
Publication date
Dec 2, 2021
California Institute of Technology
Axel SCHERER
G02 - OPTICS
Information
Patent Application
Infrared Spectrometer Having Dielectric-Polymer-Based Spectral Filter
Publication number
20210140817
Publication date
May 13, 2021
California Institute of Technology
Axel Scherer
G01 - MEASURING TESTING
Information
Patent Application
Cuvette Having High Optical Transmissivity and Method of Forming
Publication number
20200309676
Publication date
Oct 1, 2020
California Institute of Technology
Axel Scherer
G01 - MEASURING TESTING
Information
Patent Application
Compact Hyperspectral Mid-Infrared Spectrometer
Publication number
20200249091
Publication date
Aug 6, 2020
California Institute of Technology
Axel SCHERER
G01 - MEASURING TESTING
Information
Patent Application
Cuvette Having High Optical Transmissivity and Method of Forming
Publication number
20190170633
Publication date
Jun 6, 2019
California Institute of Technology
Axel Scherer
G01 - MEASURING TESTING
Information
Patent Application
System for Analyzing a Test Sample and Method Therefor
Publication number
20190170637
Publication date
Jun 6, 2019
California Institute of Technology
Axel Scherer
G01 - MEASURING TESTING
Information
Patent Application
Spectral Filter Having Controllable Spectral Bandwidth and Resolution
Publication number
20180340826
Publication date
Nov 29, 2018
California Institute of Technology
Axel SCHERER
G01 - MEASURING TESTING