Tai-Hon Philip Chang

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Chappaqua, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for selectively scaling a field emission electron gun and de...
- Patent number 5,155,412
- Issue date Oct 13, 1992
- International Business Machines Corporation
- Tai-Hon P. Chang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Compact, integrated electron beam imaging system
- Patent number 5,122,663
- Issue date Jun 16, 1992
- International Business Machine Corporation
- Tai-Hon P. Chang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Inspection of unsintered single layer or multilayer ceramics using...
- Patent number 4,621,232
- Issue date Nov 4, 1986
- International Business Machines Corporation
- Tai-Hon P. Chang
- G01 - MEASURING TESTING
Information Patent Grant
Continuously writing electron beam stitched pattern exposure system
- Patent number 4,477,729
- Issue date Oct 16, 1984
- International Business Machines Corporation
- Tai-Hon P. Chang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electron beam potential switching apparatus
- Patent number 4,426,583
- Issue date Jan 17, 1984
- International Business Machines Corporation
- Tai-Hon P. Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Combined multiple beam size and spiral scan method for electron bea...
- Patent number 3,956,635
- Issue date May 11, 1976
- International Business Machines Corporation
- Tai-Hon Philip Chang
- H01 - BASIC ELECTRIC ELEMENTS