Tai Wai David CHIK

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Hong Kong, CN

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Patents Grantslast 30 patents

Information Patent Grant
Optimized path planning for defect inspection based on effective re...
- Patent number 12,063,442
- Issue date Aug 13, 2024
- Hong Kong Applied Science and Technology Research Institute Company Limited
- Tai Wai David Chik
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Optimized Path Planning for Defect Inspection based on Effective Re...
- Publication number 20240048848
- Publication date Feb 8, 2024
- Hong Kong Applied Science and Technology Resrearch Institute Company Limited
- Tai Wai David CHIK
- G06 - COMPUTING CALCULATING COUNTING