Taichi Fujita

Person

  • Tokyo, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Prober and probe contact method

    • Patent number 7,405,584
    • Issue date Jul 29, 2008
    • Tokyo Seimitsu Co., Ltd.
    • Taichi Fujita
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents