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Taichi Fujita
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Tokyo, JP
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last 30 patents
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Patent Grant
Prober and probe contact method
Patent number
7,405,584
Issue date
Jul 29, 2008
Tokyo Seimitsu Co., Ltd.
Taichi Fujita
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
PROBER AND PROBE CONTACT METHOD
Publication number
20070268033
Publication date
Nov 22, 2007
Taichi Fujita
G01 - MEASURING TESTING