Taichi Goto

Follow

Person

Toyohashi-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 10,317,368
- Issue date Jun 11, 2019
- Hitachi, Ltd.
- Hisashi Endou
- G01 - MEASURING TESTING
Information Patent Grant
Optical body
- Patent number 9,841,619
- Issue date Dec 12, 2017
- National University Corporation Toyohashi University of Technology
- Mitsuteru Inoue
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SPIN WAVE EXCITATION/DETECTION STRUCTURE
- Publication number 20240272250
- Publication date Aug 15, 2024
- Shin-Etsu Chemical Co., Ltd.
- Taichi GOTO
- G01 - MEASURING TESTING
Information Patent Application
Q-SWITCH STRUCTURE AND METHOD OF PRODUCING Q-SWITCH STRUCTURE
- Publication number 20240250494
- Publication date Jul 25, 2024
- Shin-Etsu Chemical Co., Ltd.
- Toshiaki WATANABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ISOLATOR AND ISOLATOR MANUFACTURING METHOD
- Publication number 20230324727
- Publication date Oct 12, 2023
- Kyocera Corporation
- Taichi GOTO
- G02 - OPTICS
Information Patent Application
ISOLATOR AND ISOLATOR MANUFACTURING METHOD
- Publication number 20230288633
- Publication date Sep 14, 2023
- Kyocera Corporation
- Tomoya Sugita
- G02 - OPTICS
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20170328864
- Publication date Nov 16, 2017
- Hitachi, Ltd
- Hisashi ENDOU
- G01 - MEASURING TESTING
Information Patent Application
Optical Body
- Publication number 20120218619
- Publication date Aug 30, 2012
- National University Corporation TOYOHASHI UNIVERSITY OF TECNNOLOGY
- Mitsuteru Inoue
- G02 - OPTICS