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Taichi Murakami
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Kanagawa, JP
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Patents Grants
last 30 patents
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Patent Grant
Optical spectrum analyzer and pulse-modulated light measurement method
Patent number
11,686,617
Issue date
Jun 27, 2023
Anritsu Corporation
Taichi Murakami
G01 - MEASURING TESTING
Information
Patent Grant
OTDR measurement apparatus and control method
Patent number
11,632,172
Issue date
Apr 18, 2023
Anritsu Corporation
Ryota Takasu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Optical spectrum analyzer
Patent number
11,598,669
Issue date
Mar 7, 2023
Anritsu Corporation
Shinji Morimoto
G01 - MEASURING TESTING
Information
Patent Grant
Optical time domain reflectometer and testing method of optical tim...
Patent number
11,029,232
Issue date
Jun 8, 2021
Anritsu Corporation
Taichi Murakami
G01 - MEASURING TESTING
Information
Patent Grant
End face inspection apparatus and focused image data acquisition me...
Patent number
10,341,550
Issue date
Jul 2, 2019
Anritsu Corporation
Yasuhiro Miyake
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical time domain reflectometer and display method of optical tim...
Patent number
10,067,665
Issue date
Sep 4, 2018
Anritsu Corporation
Taichi Murakami
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL PULSE TEST DEVICE AND OPTICAL PULSE TEST METHOD
Publication number
20230400383
Publication date
Dec 14, 2023
Anritsu Corporation
Ryota TAKASU
G01 - MEASURING TESTING
Information
Patent Application
LOSS ANALYSIS DEVICE AND LOSS ANALYSIS METHOD
Publication number
20230400334
Publication date
Dec 14, 2023
Anritsu Corporation
Ryota TAKASU
G01 - MEASURING TESTING
Information
Patent Application
EVENT DETECTION DEVICE AND EVENT DETECTION METHOD
Publication number
20230400381
Publication date
Dec 14, 2023
Anritsu Corporation
Ryota TAKASU
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
OPTICAL SPECTRUM ANALYZER AND PULSE-MODULATED LIGHT MEASUREMENT METHOD
Publication number
20220307900
Publication date
Sep 29, 2022
Anritsu Corporation
Taichi MURAKAMI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SPECTRUM ANALYZER
Publication number
20220307901
Publication date
Sep 29, 2022
ANRITSU CORPORATION
Shinji MORIMOTO
G02 - OPTICS
Information
Patent Application
OTDR MEASUREMENT APPARATUS AND CONTROL METHOD
Publication number
20220123832
Publication date
Apr 21, 2022
Anritsu Corporation
Ryota TAKASU
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
OPTICAL TIME DOMAIN REFLECTOMETER AND TESTING METHOD OF OPTICAL TIM...
Publication number
20200240872
Publication date
Jul 30, 2020
Anritsu Corporation
Taichi MURAKAMI
G01 - MEASURING TESTING
Information
Patent Application
END FACE INSPECTION APPARATUS AND FOCUSED IMAGE DATA ACQUISITION ME...
Publication number
20180152617
Publication date
May 31, 2018
Anritsu Corporation
Yasuhiro MIYAKE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTICAL TIME DOMAIN REFLECTOMETER AND DISPLAY METHOD OF OPTICAL TIM...
Publication number
20170160894
Publication date
Jun 8, 2017
Anritsu Corporation
Taichi Murakami
G01 - MEASURING TESTING