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Taichi Okano
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Chichibu, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor wafer evaluation method, semiconductor wafer evaluati...
Patent number
9,431,307
Issue date
Aug 30, 2016
Showa Denko K.K.
Taichi Okano
G01 - MEASURING TESTING
Information
Patent Grant
Method of manufacturing semiconductor device, semiconductor device,...
Patent number
8,679,882
Issue date
Mar 25, 2014
Show A Denko K.K.
Taichi Okano
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Compound semiconductor multilayer structure and bipolar transistor...
Patent number
6,876,013
Issue date
Apr 5, 2005
Showa Denko K.K.
Taichi Okano
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for fabricating a GaInP epitaxial stacking structure
Patent number
6,841,435
Issue date
Jan 11, 2005
Showa Denko K.K.
Takashi Udagawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
GaInP epitaxial stacking structure and fabrication method thereof,...
Patent number
6,462,361
Issue date
Oct 8, 2002
Showa Denko K.K.
Takashi Udagawa
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
SEMICONDUCTOR WAFER EVALUATION METHOD, SEMICONDUCTOR WAFER EVALUATI...
Publication number
20140017826
Publication date
Jan 16, 2014
Taichi OKANO
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE,...
Publication number
20110272711
Publication date
Nov 10, 2011
Showa Denko K.K.
Taichi Okano
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Compound semiconductor multilayer structure and bipolar transistor...
Publication number
20030183816
Publication date
Oct 2, 2003
Taichi Okano
C30 - CRYSTAL GROWTH
Information
Patent Application
GaInP epitaxial stacking structure and fabrication method thereof a...
Publication number
20030008440
Publication date
Jan 9, 2003
Showa Denko K.K.
Takashi Udagawa
H01 - BASIC ELECTRIC ELEMENTS