Taichi TANAKA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Object detection apparatus, object detection method, and computer-r...
- Patent number 12,253,590
- Issue date Mar 18, 2025
- NEC Corporation
- Shingo Yamanouchi
- G01 - MEASURING TESTING
Information Patent Grant
Radar device, imaging method, and imaging program
- Patent number 12,085,666
- Issue date Sep 10, 2024
- NEC Corporation
- Tatsuya Sumiya
- G01 - MEASURING TESTING
Information Patent Grant
Radar signal imaging device, radar signal imaging method, and radar...
- Patent number 11,933,885
- Issue date Mar 19, 2024
- NEC Corporation
- Kazumine Ogura
- G01 - MEASURING TESTING
Information Patent Grant
Image processing device and image processing method
- Patent number 11,846,702
- Issue date Dec 19, 2023
- NEC Corporation
- Taichi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Synthetic aperture radar signal processing device and signal proces...
- Patent number 11,841,422
- Issue date Dec 12, 2023
- NEC Corporation
- Daisuke Ikefuji
- G01 - MEASURING TESTING
Information Patent Grant
Synthetic aperture radar image analysis system, synthetic aperture...
- Patent number 11,841,421
- Issue date Dec 12, 2023
- NEC Corporation
- Taichi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Synthetic aperture radar signal analysis device, synthetic aperture...
- Patent number 11,835,619
- Issue date Dec 5, 2023
- Daisuke Ikefuji
- G01 - MEASURING TESTING
Information Patent Grant
Synthetic-aperture-radar image processing device and image processi...
- Patent number 11,754,704
- Issue date Sep 12, 2023
- NEC Corporation
- Daisuke Ikefuji
- G01 - MEASURING TESTING
Information Patent Grant
SAR image analysis system, image processing apparatus, image proces...
- Patent number 11,709,254
- Issue date Jul 25, 2023
- NEC Corporation
- Taichi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Image analysis device, image analysis method, and computer-readable...
- Patent number 11,487,001
- Issue date Nov 1, 2022
- NEC Corporation
- Taichi Tanaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Synthetic aperture radar signal processing device and method
- Patent number 11,460,573
- Issue date Oct 4, 2022
- NEC Corporation
- Daisuke Ikefuji
- G01 - MEASURING TESTING
Information Patent Grant
Image processing apparatus, image processing method, image processi...
- Patent number 11,397,261
- Issue date Jul 26, 2022
- NEC Corporation
- Taichi Tanaka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SOUNDNESS EVALUATION APPARATUS, SOUNDNESS EVALUATION METHOD, AND CO...
- Publication number 20250085187
- Publication date Mar 13, 2025
- NEC Corporation
- Kosuke KINOSHITA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE ANALYSIS DEVICE AND IMAGE ANALYSIS METHOD
- Publication number 20240280689
- Publication date Aug 22, 2024
- NEC Corporation
- Taichi Tanaka
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING DEVICE AND SIGNAL PROCESSING METHOD
- Publication number 20240193856
- Publication date Jun 13, 2024
- NEC Corporation
- Yuki Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHANGE DETECTION DEVICE AND CHANGE DETECTION METHOD
- Publication number 20240077605
- Publication date Mar 7, 2024
- NEC Corporation
- Yuki Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND FLOAT
- Publication number 20240068960
- Publication date Feb 29, 2024
- NEC Corporation
- Taichi Tanaka
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING DEVICE, SIGNAL PROCESSING METHOD, AND RECORDING M...
- Publication number 20230393265
- Publication date Dec 7, 2023
- NEC Corporation
- Yuki Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
IMAGE ANALYSIS DEVICE AND IMAGE ANALYSIS METHOD
- Publication number 20230377201
- Publication date Nov 23, 2023
- NEC Corporation
- Taichi Tanaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA PROCESSING DEVICE AND DATA PROCESSING METHOD
- Publication number 20230351567
- Publication date Nov 2, 2023
- NEC Corporation
- Taichi TANAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE ANALYSIS DEVICE AND IMAGE ANALYSIS METHOD
- Publication number 20230341544
- Publication date Oct 26, 2023
- NEC Corporation
- Taichi Tanaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE ANALYZING DEVICE AND IMAGE ANALYZING METHOD
- Publication number 20230133736
- Publication date May 4, 2023
- NEC Corporation
- Taichi TANAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OBJECT DETECTION APPARATUS, SYSTEM, AND METHOD, DATA CONVERSION UNI...
- Publication number 20230045129
- Publication date Feb 9, 2023
- NEC Corporation
- Nagma Samreen KHAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OBJECT DETECTION APPARATUS, OBJECT DETECTION METHOD, AND COMPUTER-R...
- Publication number 20220413115
- Publication date Dec 29, 2022
- NEC Corporation
- Shingo YAMANOUCHI
- G01 - MEASURING TESTING
Information Patent Application
PHASE UNWRAPPING DEVICE AND PHASE UNWRAPPING METHOD
- Publication number 20220283294
- Publication date Sep 8, 2022
- NEC Corporation
- Taichi TANAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING DEVICE AND IMAGE PROCESSING METHOD
- Publication number 20220268922
- Publication date Aug 25, 2022
- NEC Corporation
- Taichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING DEVICE AND IMAGE PROCESSING METHOD
- Publication number 20220262096
- Publication date Aug 18, 2022
- NEC Corporation
- Taichi TANAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADAR DEVICE, IMAGING METHOD, AND IMAGING PROGRAM
- Publication number 20220260673
- Publication date Aug 18, 2022
- NEC Corporation
- Tatsuya SUMIYA
- G01 - MEASURING TESTING
Information Patent Application
SYNTHETIC APERTURE RADAR SIGNAL PROCESSING DEVICE AND SIGNAL PROCES...
- Publication number 20220221577
- Publication date Jul 14, 2022
- NEC Corporation
- Daisuke IKEFUJI
- G01 - MEASURING TESTING
Information Patent Application
SYNTHETIC-APERTURE-RADAR IMAGE PROCESSING DEVICE AND IMAGE PROCESSI...
- Publication number 20220179065
- Publication date Jun 9, 2022
- NEC Corporation
- Daisuke IKEFUJI
- G01 - MEASURING TESTING
Information Patent Application
RADAR SYSTEM AND IMAGING METHOD
- Publication number 20220171052
- Publication date Jun 2, 2022
- NEC Corporation
- Kazumine OGURA
- G01 - MEASURING TESTING
Information Patent Application
RADAR SIGNAL IMAGING DEVICE, RADAR SIGNAL IMAGING METHOD, AND RADAR...
- Publication number 20210239829
- Publication date Aug 5, 2021
- NEC Corporation
- Kazumine OGURA
- G01 - MEASURING TESTING
Information Patent Application
SYNTHETIC APERTURE RADAR SIGNAL ANALYSIS DEVICE, SYNTHETIC APERTURE...
- Publication number 20210223389
- Publication date Jul 22, 2021
- NEC Corporation
- Daisuke IKEFUJI
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, CONTROL METHOD, AND PROGRAM
- Publication number 20210224720
- Publication date Jul 22, 2021
- NEC Corporation
- Kengo MAKINO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, IMAGE PROCESSI...
- Publication number 20210181336
- Publication date Jun 17, 2021
- NEC Corporation
- Taichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
SYNTHETIC APERTURE RADAR IMAGE ANALYSIS SYSTEM, SYNTHETIC APERTURE...
- Publication number 20210132214
- Publication date May 6, 2021
- NEC Corporation
- Taichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
SYNTHETIC APERTURE RADAR SIGNAL PROCESSING DEVICE AND METHOD
- Publication number 20210072376
- Publication date Mar 11, 2021
- NEC Corporation
- Daisuke IKEFUJI
- G01 - MEASURING TESTING
Information Patent Application
SAR IMAGE ANALYSIS SYSTEM, IMAGE PROCESSING APPARATUS, IMAGE PROCES...
- Publication number 20200348411
- Publication date Nov 5, 2020
- NEC Corporation
- Taichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND S...
- Publication number 20200166626
- Publication date May 28, 2020
- NEC Corporation
- Hisatoshi TORIYA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE ANALYSIS DEVICE, IMAGE ANALYSIS METHOD, AND COMPUTER-READABLE...
- Publication number 20200096628
- Publication date Mar 26, 2020
- NEC Corporation
- Taichi TANAKA
- G06 - COMPUTING CALCULATING COUNTING

Taichi TANAKA

Person

Patents Grantslast 30 patents

Object detection apparatus, object detection method, and computer-r...

Radar device, imaging method, and imaging program

Radar signal imaging device, radar signal imaging method, and radar...

Image processing device and image processing method

Synthetic aperture radar signal processing device and signal proces...

Synthetic aperture radar image analysis system, synthetic aperture...

Synthetic aperture radar signal analysis device, synthetic aperture...

Synthetic-aperture-radar image processing device and image processi...

SAR image analysis system, image processing apparatus, image proces...

Image analysis device, image analysis method, and computer-readable...

Synthetic aperture radar signal processing device and method

Image processing apparatus, image processing method, image processi...

Patents Applicationslast 30 patents

SOUNDNESS EVALUATION APPARATUS, SOUNDNESS EVALUATION METHOD, AND CO...

IMAGE ANALYSIS DEVICE AND IMAGE ANALYSIS METHOD

SIGNAL PROCESSING DEVICE AND SIGNAL PROCESSING METHOD

CHANGE DETECTION DEVICE AND CHANGE DETECTION METHOD

MEASUREMENT SYSTEM AND FLOAT

SIGNAL PROCESSING DEVICE, SIGNAL PROCESSING METHOD, AND RECORDING M...

IMAGE ANALYSIS DEVICE AND IMAGE ANALYSIS METHOD

DATA PROCESSING DEVICE AND DATA PROCESSING METHOD

IMAGE ANALYSIS DEVICE AND IMAGE ANALYSIS METHOD

IMAGE ANALYZING DEVICE AND IMAGE ANALYZING METHOD

OBJECT DETECTION APPARATUS, SYSTEM, AND METHOD, DATA CONVERSION UNI...

OBJECT DETECTION APPARATUS, OBJECT DETECTION METHOD, AND COMPUTER-R...

PHASE UNWRAPPING DEVICE AND PHASE UNWRAPPING METHOD

IMAGE PROCESSING DEVICE AND IMAGE PROCESSING METHOD

IMAGE PROCESSING DEVICE AND IMAGE PROCESSING METHOD

RADAR DEVICE, IMAGING METHOD, AND IMAGING PROGRAM

SYNTHETIC APERTURE RADAR SIGNAL PROCESSING DEVICE AND SIGNAL PROCES...

SYNTHETIC-APERTURE-RADAR IMAGE PROCESSING DEVICE AND IMAGE PROCESSI...

RADAR SYSTEM AND IMAGING METHOD

RADAR SIGNAL IMAGING DEVICE, RADAR SIGNAL IMAGING METHOD, AND RADAR...

SYNTHETIC APERTURE RADAR SIGNAL ANALYSIS DEVICE, SYNTHETIC APERTURE...

INFORMATION PROCESSING APPARATUS, CONTROL METHOD, AND PROGRAM

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, IMAGE PROCESSI...

SYNTHETIC APERTURE RADAR IMAGE ANALYSIS SYSTEM, SYNTHETIC APERTURE...

SYNTHETIC APERTURE RADAR SIGNAL PROCESSING DEVICE AND METHOD

SAR IMAGE ANALYSIS SYSTEM, IMAGE PROCESSING APPARATUS, IMAGE PROCES...

INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND S...

IMAGE ANALYSIS DEVICE, IMAGE ANALYSIS METHOD, AND COMPUTER-READABLE...