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Taichiro YAMASHITA

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automated analyzing device
    • Patent number 11,933,800
    • Issue date Mar 19, 2024
    • Hitachi High-Technologies Corporation
    • Taichiro Yamashita
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,927,032
    • Issue date Mar 12, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro Yamashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,169,168
    • Issue date Nov 9, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro Yamashita
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Connection Device and Automated System for Inspecting Specimen
    • Publication number 20240142479
    • Publication date May 2, 2024
    • Hitachi High-Tech Corporation
    • Shigeki YAMAGUCHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTROLYTE ANALYZER
    • Publication number 20240094160
    • Publication date Mar 21, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Takushi MIYAKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEPARATION COLUMN CONNECTION DEVICE AND SEPARATION DEVICE
    • Publication number 20240060941
    • Publication date Feb 22, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro YAMASHITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20230324428
    • Publication date Oct 12, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Tsukasa SUENARI
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPENING AND CLOSING LID DEVICE AND AUTOMATIC ANALYZER INCLUDING SAME
    • Publication number 20230258675
    • Publication date Aug 17, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro YAMASHITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20230184793
    • Publication date Jun 15, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Yuri KAJIHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20230070182
    • Publication date Mar 9, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Yuri Kajihara
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE CONTAINER GRIPPING APPARATUS, SAMPLE CONVEYANCE APPARATUS, A...
    • Publication number 20220357354
    • Publication date Nov 10, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro YAMASHITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    INTERLOCK UNIT AND AUTOMATED ANALYZER EQUIPPED WITH SAME
    • Publication number 20220206022
    • Publication date Jun 30, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro YAMASHITA
    • E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220178955
    • Publication date Jun 9, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Tsukasa Suenari
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20210349116
    • Publication date Nov 11, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro YAMASHITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20210062553
    • Publication date Mar 4, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro YAMASHITA
    • E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
  • Information Patent Application

    Automated Analyzing Device
    • Publication number 20210063423
    • Publication date Mar 4, 2021
    • Hitachi High-Technologies Corporation
    • Taichiro YAMASHITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS APPARATUS
    • Publication number 20210063422
    • Publication date Mar 4, 2021
    • Hitachi High-Technologies Corporation
    • Taichiro YAMASHITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automated Analyzer
    • Publication number 20200191814
    • Publication date Jun 18, 2020
    • Hitachi High-Technologies Corporation
    • Taichiro YAMASHITA
    • G01 - MEASURING TESTING