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Taiichi Banno
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Hachioji, JP
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last 30 patents
Information
Patent Grant
Automatic analyzing apparatus
Patent number
4,844,887
Issue date
Jul 4, 1989
Olympus Optical Co., Ltd.
Kevin Galle
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzing apparatus
Patent number
4,781,891
Issue date
Nov 1, 1988
Olympus Optical Co., Ltd.
Kevin Galle
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzing apparatus
Patent number
4,634,576
Issue date
Jan 6, 1987
Olympus Optical Co. Ltd.
Kevin Galle
G01 - MEASURING TESTING
Information
Patent Grant
Liquid distributing device for use in chemical analyzer
Patent number
4,591,568
Issue date
May 27, 1986
Olympus Optical Co., Ltd.
Taiichi Banno
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for correcting a curve relating an absorbance...
Patent number
4,587,624
Issue date
May 6, 1986
Olympus Optical Co., Ltd.
Taiichi Banno
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzing apparatus
Patent number
4,558,946
Issue date
Dec 17, 1985
Olympus Optical Co. Ltd.
Kevin Galle
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzing apparatus
Patent number
4,517,160
Issue date
May 14, 1985
Olympus Optical Company Limited
Kevin Galle
G01 - MEASURING TESTING
Information
Patent Grant
Photometering apparatus for use in chemical analyzer
Patent number
4,498,780
Issue date
Feb 12, 1985
Olympus Optical Co., Ltd.
Taiichi Banno
G01 - MEASURING TESTING
Information
Patent Grant
Method of analyzing chemical substances
Patent number
4,472,505
Issue date
Sep 18, 1984
Olympus Optical Co. Ltd.
Sugio Manabe
G01 - MEASURING TESTING
Information
Patent Grant
Liquid distributing device for use in chemical analyzer
Patent number
4,448,752
Issue date
May 15, 1984
Olympus Optical Co., Ltd.
Taiichi Banno
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzing apparatus
Patent number
4,338,279
Issue date
Jul 6, 1982
Olympus Optical Company Limited
Ryoichi Orimo
G01 - MEASURING TESTING