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Tairo OGURA
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Kyoto-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Supercritical fluid device
Patent number
11,243,193
Issue date
Feb 8, 2022
Shimadzu Corporation
Yuka Fujito
G01 - MEASURING TESTING
Information
Patent Grant
Ion source for mass spectrometer
Patent number
11,049,711
Issue date
Jun 29, 2021
Shimadzu Corporation
Tairo Ogura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer
Patent number
10,615,017
Issue date
Apr 7, 2020
Shimadzu Corporation
Tairo Ogura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MASS SPECTROMETRY CONTROL DEVICE, MASS SPECTROMETRY DEVICE, MASS SP...
Publication number
20230400440
Publication date
Dec 14, 2023
Shimadzu Corporation
Tairo OGURA
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS DEVICE FOR DATA OBTAINED IN MASS SPECTROMETRY, MASS SPECTR...
Publication number
20230384263
Publication date
Nov 30, 2023
SHIMADZU CORPORATION
Tairo OGURA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MEASURING OR IDENTIFYING A COMPONENT OF INTEREST IN SPEC...
Publication number
20230184643
Publication date
Jun 15, 2023
SHIMADZU CORPORATION
Janusz B. PAWLISZYN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION SOURCE FOR MASS SPECTROMETER
Publication number
20210151311
Publication date
May 20, 2021
SHIMADZU CORPORATION
Tairo OGURA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SUPERCRITICAL FLUID DEVICE
Publication number
20200025725
Publication date
Jan 23, 2020
SHIMADZU CORPORATION
Yuka FUJITO
G01 - MEASURING TESTING
Information
Patent Application
LIQUID CHROMATOGRAPH
Publication number
20170343519
Publication date
Nov 30, 2017
SHIMADZU CORPORATION
Tairo OGURA
G01 - MEASURING TESTING
Information
Patent Application
MASS SPECTROMETER
Publication number
20160042929
Publication date
Feb 11, 2016
SHIMADZU CORPORATION
Tairo OGURA
G01 - MEASURING TESTING