Taisaku Seino

Person

  • Hitachinaka, JP

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    CHEMICAL ANALYZER

    • Publication number 20130121883
    • Publication date May 16, 2013
    • Hitachi High-Technologies Corporation
    • Hironobu YAMAKAWA
    • B08 - CLEANING
  • Information Patent Application

    CHEMICAL ANALYZER

    • Publication number 20120183439
    • Publication date Jul 19, 2012
    • Hitachi High-Technologies Corporation
    • Taisaku Seino
    • G01 - MEASURING TESTING
  • Information Patent Application

    CHEMICAL ANALYZER

    • Publication number 20120107180
    • Publication date May 3, 2012
    • Hitachi High-Technologies Corporation
    • Hironobu Yamakawa
    • B08 - CLEANING
  • Information Patent Application

    CHEMICAL ANALYSIS DEVICE

    • Publication number 20090016931
    • Publication date Jan 15, 2009
    • Hitachi High-Technologies Corporation
    • Taisaku Seino
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Chemical analysis apparatus and chemical analysis cartridge

    • Publication number 20060159586
    • Publication date Jul 20, 2006
    • Shigeyuki Sasaki
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Chemical analyzing apparatus

    • Publication number 20060073584
    • Publication date Apr 6, 2006
    • Shigeyuki Sasaki
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Biological sample optical measuring method and biological sample op...

    • Publication number 20040239916
    • Publication date Dec 2, 2004
    • Taisaku Seino
    • G01 - MEASURING TESTING
  • Information Patent Application

    Capillary electrophoresis device

    • Publication number 20030221965
    • Publication date Dec 4, 2003
    • Taisaku Seino
    • G01 - MEASURING TESTING
  • Information Patent Application

    Method in inspecting DNA and apparatus therefor

    • Publication number 20030087282
    • Publication date May 8, 2003
    • Hitachi, Ltd. Incorporation: Japan
    • Yoshitada Oshida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Apparatus and method for measuring micro area in specimen

    • Publication number 20030081209
    • Publication date May 1, 2003
    • Satoshi Takahashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Method and apparatus for inspecting DNA and method for detecting fl...

    • Publication number 20020140933
    • Publication date Oct 3, 2002
    • Hitachi, Ltd
    • Yoshitada Oshida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Test chamber

    • Publication number 20020114742
    • Publication date Aug 22, 2002
    • Hitachi, Ltd.
    • Satoshi Takahashi
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL