Taisia Tsukruk Lou

Person

St. Louis, MO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for evaluating corrosion loss
- Patent number 10,937,006
- Issue date Mar 2, 2021
- The Boeing Company
- Roger W. Engelbart
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Terahertz inspection for additively manufactured materials
- Patent number 10,773,458
- Issue date Sep 15, 2020
- The Boeing Company
- Taisia Tsukruk Lou
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
System and method for quantifying x-ray backscatter system performance
- Patent number 10,613,041
- Issue date Apr 7, 2020
- The Boeing Company
- Matthew T. Grimshaw
- G01 - MEASURING TESTING
Information Patent Grant
System and method for quantifying X-ray backscatter system performance
- Patent number 10,436,724
- Issue date Oct 8, 2019
- The Boeing Company
- Matthew T. Grimshaw
- G01 - MEASURING TESTING
Information Patent Grant
Detecting gaps between fasteners and openings
- Patent number 9,689,813
- Issue date Jun 27, 2017
- The Boeing Company
- Taisia Tsukruk Lou
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructively evaluating a hidden workpiece
- Patent number 9,506,879
- Issue date Nov 29, 2016
- The Boeing Company
- Roger W. Engelbart
- G01 - MEASURING TESTING
Information Patent Grant
System and method for quantifying X-ray backscatter system performance
- Patent number 9,398,676
- Issue date Jul 19, 2016
- The Boeing Company
- Matthew T. Grimshaw
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR QUANTIFYING X-RAY BACKSCATTER SYSTEM PERFORMANCE
- Publication number 20200003707
- Publication date Jan 2, 2020
- The Boeing Company
- Matthew T. Grimshaw
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Terahertz Inspection for Additively Manufactured Materials
- Publication number 20190240908
- Publication date Aug 8, 2019
- The Boeing Company
- Taisia Tsukruk Lou
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR EVALUATING CORROSION LOSS
- Publication number 20180357613
- Publication date Dec 13, 2018
- The Boeing Company
- Roger W. Engelbart
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Quantifying X-Ray Backscatter System Performance
- Publication number 20170227478
- Publication date Aug 10, 2017
- The Boeing Company
- Matthew T. Grimshaw
- G01 - MEASURING TESTING
Information Patent Application
Detecting Gaps Between Fasteners and Openings
- Publication number 20160252468
- Publication date Sep 1, 2016
- The Boeing Company
- Taisia Tsukruk Lou
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Quantifying X-Ray Backscatter System Performance
- Publication number 20150319832
- Publication date Nov 5, 2015
- The Boeing Company
- Matthew T. Grimshaw
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVELY EVALUATING A HIDDEN WORKPIECE
- Publication number 20150055757
- Publication date Feb 26, 2015
- The Boeing Company
- Roger W. Engelbart
- G01 - MEASURING TESTING

Taisia Tsukruk Lou

Person

Patents Grantslast 30 patents

Method and system for evaluating corrosion loss

Terahertz inspection for additively manufactured materials

System and method for quantifying x-ray backscatter system performance

System and method for quantifying X-ray backscatter system performance

Detecting gaps between fasteners and openings

Method and system for non-destructively evaluating a hidden workpiece

System and method for quantifying X-ray backscatter system performance

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR QUANTIFYING X-RAY BACKSCATTER SYSTEM PERFORMANCE

Terahertz Inspection for Additively Manufactured Materials

METHOD AND SYSTEM FOR EVALUATING CORROSION LOSS

System and Method for Quantifying X-Ray Backscatter System Performance

Detecting Gaps Between Fasteners and Openings

System and Method for Quantifying X-Ray Backscatter System Performance

METHOD AND SYSTEM FOR NON-DESTRUCTIVELY EVALUATING A HIDDEN WORKPIECE