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Taisuke Ota
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Osaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Optical microscope and spectrometry method
Patent number
9,927,297
Issue date
Mar 27, 2018
Nanophoton Corporation
Satoshi Kawata
G02 - OPTICS
Information
Patent Grant
Microscope
Patent number
9,582,088
Issue date
Feb 28, 2017
Nanophoton Corporation
Satoshi Kawata
G02 - OPTICS
Information
Patent Grant
Spectrometry device and spectrometry method
Patent number
9,435,741
Issue date
Sep 6, 2016
Nanophoton Corporation
Minoru Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Raman microscope and Raman spectrometric measuring method
Patent number
9,188,538
Issue date
Nov 17, 2015
Nanophoton Corporation
Shogo Kawano
G01 - MEASURING TESTING
Information
Patent Grant
Optical microscope and spectrum measuring method
Patent number
8,081,309
Issue date
Dec 20, 2011
Nanophoton Corp.
Minoru Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Optical microscope and spectrum measuring method
Patent number
7,561,265
Issue date
Jul 14, 2009
Nanophoton Corp.
Minoru Kobayashi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
RAMAN MICROSCOPE AND RAMAN SPECTROMETRIC MEASURING METHOD
Publication number
20140132955
Publication date
May 15, 2014
Shogo Kawano
G01 - MEASURING TESTING
Information
Patent Application
MICROSCOPE
Publication number
20140063226
Publication date
Mar 6, 2014
NANOPHOTON CORPORATION
Satoshi Kawata
G02 - OPTICS
Information
Patent Application
OPTICAL MICROSCOPE AND SPECTROMETRY METHOD
Publication number
20140002819
Publication date
Jan 2, 2014
NANOPHOTON CORPORATION
Satoshi Kawata
G02 - OPTICS
Information
Patent Application
SPECTROMETRY DEVICE AND SPECTROMETRY METHOD
Publication number
20130162990
Publication date
Jun 27, 2013
Nanophoton Corporation
Minoru Kobayashi
G01 - MEASURING TESTING
Information
Patent Application
Optical microscope and spectrum measuring method
Publication number
20100128263
Publication date
May 27, 2010
NANOPHOTON CORP.
Minoru Kobayashi
G02 - OPTICS
Information
Patent Application
Optical microscope and spectrum measuring method
Publication number
20070132994
Publication date
Jun 14, 2007
Nanophoton Corp.
Minoru Kobayashi
G01 - MEASURING TESTING