Taizo Nakamura

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Photoelectric encoder with optical grating
- Patent number 8,658,964
- Issue date Feb 25, 2014
- Mitutoyo Corporation
- Emi Kaneko
- G01 - MEASURING TESTING
Information Patent Grant
Surface profile measurement apparatus
- Patent number 6,646,748
- Issue date Nov 11, 2003
- Mitutoyo Corporation
- Taizo Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Focus detection unit and optical measuring instrument having the same
- Patent number 6,407,800
- Issue date Jun 18, 2002
- Mitutoyo Corporation
- Seiji Shimokawa
- G02 - OPTICS
Information Patent Grant
Projection measuring instrument
- Patent number 6,147,758
- Issue date Nov 14, 2000
- Mitutoyo Corporation
- Kenji Okabe
- G01 - MEASURING TESTING
Information Patent Grant
Focus detection unit and microscope using the focus detection unit
- Patent number 5,963,366
- Issue date Oct 5, 1999
- Mitutoyo Corporation
- Taizo Nakamura
- G02 - OPTICS
Information Patent Grant
Method and system for measuring an inner diameter of a hole formed...
- Patent number 5,909,284
- Issue date Jun 1, 1999
- Mitutoyo Corporation
- Taizo Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Optical type measuring scanner
- Patent number 4,692,629
- Issue date Sep 8, 1987
- Mitutoyo Mfg., Co., Ltd.
- Taizo Nakamura
- G02 - OPTICS
Information Patent Grant
Microscope
- Patent number 4,639,098
- Issue date Jan 27, 1987
- Mitutoyo Mfg. Co., Ltd.
- Tsutomu Aoyama
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
PHOTOELECTRIC ENCODER
- Publication number 20110095171
- Publication date Apr 28, 2011
- Mitutoyo Corporation
- Emi KANEKO
- G01 - MEASURING TESTING
Information Patent Application
Surface profile measurement apparatus
- Publication number 20020018215
- Publication date Feb 14, 2002
- Mitutoyo Corporation
- Taizo Nakamura
- G01 - MEASURING TESTING

Taizo Nakamura

Person

Patents Grantslast 30 patents

Photoelectric encoder with optical grating

Surface profile measurement apparatus

Focus detection unit and optical measuring instrument having the same

Projection measuring instrument

Focus detection unit and microscope using the focus detection unit

Method and system for measuring an inner diameter of a hole formed...

Optical type measuring scanner

Microscope

Patents Applicationslast 30 patents

PHOTOELECTRIC ENCODER

Surface profile measurement apparatus