Taizo Umezaki

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Aichi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Object detection device for recognizing an object in an input frame...
- Patent number 9,977,967
- Issue date May 22, 2018
- MegaChips Corporation
- Taizo Umezaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Object detection device for recognizing an object in an input frame...
- Patent number 9,652,677
- Issue date May 16, 2017
- MegaChips Corporation
- Taizo Umezaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional shape measuring device, method for acquiring holo...
- Patent number 9,494,411
- Issue date Nov 15, 2016
- 3DRAGONS, LLC
- Hideyoshi Horimai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Data processor, data processing system, and computer-readable recor...
- Patent number 9,230,156
- Issue date Jan 5, 2016
- MegaChips Corporation
- Taizo Umezaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection apparatus
- Patent number 7,333,650
- Issue date Feb 19, 2008
- Nidek Co., Ltd.
- Takayasu Yamamoto
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
OBJECT DETECTION DEVICE
- Publication number 20170220868
- Publication date Aug 3, 2017
- MegaChips Corporation
- Taizo UMEZAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Three-Dimensional Shape Measuring Device, Method for Acquiring Holo...
- Publication number 20150300803
- Publication date Oct 22, 2015
- 3DRAGONS, LLC
- Hideyoshi HORIMAI
- G01 - MEASURING TESTING
Information Patent Application
OBJECT DETECTION DEVICE
- Publication number 20150302258
- Publication date Oct 22, 2015
- MegaChips Corporation
- Taizo UMEZAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA PROCESSOR, DATA PROCESSING SYSTEM, AND COMPUTER-READABLE RECOR...
- Publication number 20140003664
- Publication date Jan 2, 2014
- MegaChips Corporation
- Taizo Umezaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect inspection apparatus
- Publication number 20050002560
- Publication date Jan 6, 2005
- NIDEK CO., LTD.
- Takayasu Yamamoto
- G06 - COMPUTING CALCULATING COUNTING