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Takaaki Hagiwara

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer and analysis method
    • Patent number 11,959,914
    • Issue date Apr 16, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Tatsuki Takakura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis apparatus
    • Patent number 11,740,254
    • Issue date Aug 29, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Yuichiro Ota
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzing device
    • Patent number 10,921,337
    • Issue date Feb 16, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Hiroki Fujita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,012,663
    • Issue date Jul 3, 2018
    • Hitachi High-Technologies Corporation
    • Takaaki Hagiwara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 9,977,041
    • Issue date May 22, 2018
    • Hitachi High-Technologies Corporation
    • Yoshihiro Yamashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,958,468
    • Issue date May 1, 2018
    • Hitachi High-Technologies Corporation
    • Yoshihiro Yamashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer and reagent processing method in automatic analyzer
    • Patent number 9,709,587
    • Issue date Jul 18, 2017
    • Hitachi High-Technologies Corporation
    • Takaaki Hagiwara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Immunological analyzing apparatus
    • Patent number 9,494,611
    • Issue date Nov 15, 2016
    • Hitachi High-Technologies Corporation
    • Takaaki Hagiwara
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Automated Analysis Device, and Abnormality Detecting Method
    • Publication number 20220221477
    • Publication date Jul 14, 2022
    • Hitachi High-Tech Corporation
    • Hirobumi SHIOHATA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND METHOD THEREOF
    • Publication number 20220011326
    • Publication date Jan 13, 2022
    • Takaaki HAGIWARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND ANALYSIS METHOD
    • Publication number 20200240981
    • Publication date Jul 30, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Tatsuki TAKAKURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Apparatus
    • Publication number 20200209273
    • Publication date Jul 2, 2020
    • Yuichiro OTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZING DEVICE
    • Publication number 20180180637
    • Publication date Jun 28, 2018
    • Hitachi High-Technologies Corporation
    • Hiroki FUJITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20170205435
    • Publication date Jul 20, 2017
    • Hitachi High-Technologies Corporation
    • Takaaki HAGIWARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20160154016
    • Publication date Jun 2, 2016
    • Hitachi High-Technologies Corporation
    • Yoshihiro YAMASHITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20150293135
    • Publication date Oct 15, 2015
    • Hitachi High-Technologies Corporation
    • Yoshihiro Yamashita
    • G01 - MEASURING TESTING
  • Information Patent Application

    IMMUNOLOGICAL ANALYZING APPARATUS
    • Publication number 20150212102
    • Publication date Jul 30, 2015
    • Hitachi High-Technologies Corporation
    • Takaaki HAGIWARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND REAGENT PROCESSING METHOD IN AUTOMATI...
    • Publication number 20140356233
    • Publication date Dec 4, 2014
    • Hitachi High-Technologies Corporation
    • Takaaki Hagiwara
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20120251391
    • Publication date Oct 4, 2012
    • Hitachi High-Technologies Corporation
    • Takaaki Hagiwara
    • G01 - MEASURING TESTING