Takaaki Hirata

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Laser gas analyzer
- Patent number 9,671,333
- Issue date Jun 6, 2017
- Yokogawa Electric Corporation
- Takaaki Hirata
- G01 - MEASURING TESTING
Information Patent Grant
Laser gas analyzer
- Patent number 9,347,877
- Issue date May 24, 2016
- Yokogawa Electric Corporation
- Takaaki Hirata
- G01 - MEASURING TESTING
Information Patent Grant
Optical characteristic measuring apparatus
- Patent number 7,692,796
- Issue date Apr 6, 2010
- Yokogawa Electric Corporation
- Takaaki Hirata
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical characteristic measuring apparatus
- Patent number 7,609,386
- Issue date Oct 27, 2009
- Yokogawa Electric Corporation
- Takaaki Hirata
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wavelength monitor using interference signals
- Patent number 7,595,886
- Issue date Sep 29, 2009
- Yokogawa Electric Corporation
- Takaaki Hirata
- G01 - MEASURING TESTING
Information Patent Grant
Optical characteristic measuring apparatus
- Patent number 7,538,885
- Issue date May 26, 2009
- Yokogawa Electric Corporation
- Takaaki Hirata
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
SHG laser light source and method of modulation for use therewith
- Patent number 6,738,398
- Issue date May 18, 2004
- Yokogawa Electric Corporation
- Takaaki Hirata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical-fiber inspection device
- Patent number 6,008,487
- Issue date Dec 28, 1999
- Yokogawa Electric Corporation
- Yoshihiko Tachikawa
- G01 - MEASURING TESTING
Information Patent Grant
Optical frequency domain reflectometer for use as an optical fiber...
- Patent number 5,844,235
- Issue date Dec 1, 1998
- Yokogawa Electric Corporation
- Yoshihiko Tachikawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating a semiconductor optical device
- Patent number 5,145,792
- Issue date Sep 8, 1992
- Optical Measurement Technology Development Co., Ltd.
- Takaaki Hirata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nuclear magnetic resonance imaging device
- Patent number 4,694,250
- Issue date Sep 15, 1987
- Yokogawa Electric Corporation
- Hideto Iwaoka
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
LASER GAS ANALYZER
- Publication number 20150260646
- Publication date Sep 17, 2015
- YOKOGAWA ELECTRIC CORPORATION
- Takaaki Hirata
- G01 - MEASURING TESTING
Information Patent Application
LASER GAS ANALYZER
- Publication number 20150185144
- Publication date Jul 2, 2015
- YOKOGAWA ELECTRIC CORPORATION
- Takaaki Hirata
- G01 - MEASURING TESTING
Information Patent Application
LASER GAS ANALYZER
- Publication number 20130135619
- Publication date May 30, 2013
- YOKOGAWA ELECTRIC CORPORATION
- Takaaki Hirata
- G01 - MEASURING TESTING
Information Patent Application
Optical Characteristic Measuring Apparatus
- Publication number 20090079991
- Publication date Mar 26, 2009
- YOKOGAWA ELECTRIC CORPORATION
- Takaaki Hirata
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL CHARACTERISTIC MEASURING APPARATUS
- Publication number 20080316495
- Publication date Dec 25, 2008
- Takaaki HIRATA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Wavelength monitor
- Publication number 20060290937
- Publication date Dec 28, 2006
- YOKOGAWA ELECTRIC CORPORATION
- Takaaki Hirata
- G02 - OPTICS
Information Patent Application
Optical characteristic measuring apparatus
- Publication number 20060279741
- Publication date Dec 14, 2006
- YOKOGAWA ELECTRIC CORPORATION
- Takaaki Hirata
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SHG laser light source and method of modulation for use therewith
- Publication number 20010005388
- Publication date Jun 28, 2001
- Takaaki Hirata
- G02 - OPTICS

Takaaki Hirata

Person

Patents Grantslast 30 patents

Laser gas analyzer

Laser gas analyzer

Optical characteristic measuring apparatus

Optical characteristic measuring apparatus

Wavelength monitor using interference signals

Optical characteristic measuring apparatus

SHG laser light source and method of modulation for use therewith

Optical-fiber inspection device

Optical frequency domain reflectometer for use as an optical fiber...

Method of fabricating a semiconductor optical device

Nuclear magnetic resonance imaging device

Patents Applicationslast 30 patents

LASER GAS ANALYZER

LASER GAS ANALYZER

LASER GAS ANALYZER

Optical Characteristic Measuring Apparatus

OPTICAL CHARACTERISTIC MEASURING APPARATUS

Wavelength monitor

Optical characteristic measuring apparatus

SHG laser light source and method of modulation for use therewith