TREA

Takaaki HOSHINO

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  • Nirasaki City, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Method for pre-heating probe card
    • Patent number 9,519,022
    • Issue date Dec 13, 2016
    • Tokyo Electron Limited
    • Hiroshi Yamada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Wafer inspection apparatus
    • Patent number 9,201,115
    • Issue date Dec 1, 2015
    • Tokyo Electron Limited
    • Hiroshi Yamada
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents