Takaaki Kumazawa

Person

Chigasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and program for selecting product to be inspected
- Patent number 7,899,567
- Issue date Mar 1, 2011
- Hitachi, Ltd.
- Masataka Tanaka
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for calculating environmental load, program for calculating...
- Patent number 7,840,361
- Issue date Nov 23, 2010
- Hitachi, Ltd.
- Takaaki Kumazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for test conditions
- Patent number 6,895,346
- Issue date May 17, 2005
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Photomask for test wafers
- Patent number 6,841,405
- Issue date Jan 11, 2005
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
System for testing electronic devices
- Patent number 6,780,660
- Issue date Aug 24, 2004
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing electronic devices indicating short-circuit
- Patent number 6,771,077
- Issue date Aug 3, 2004
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing electronic devices
- Patent number 6,770,496
- Issue date Aug 3, 2004
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND PROGRAM FOR SELECTING PRODUCT TO BE INSPECTED
- Publication number 20080269936
- Publication date Oct 30, 2008
- Masataka TANAKA
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR CALCULATING ENVIRONMENTAL LOAD, PROGRAM FOR CALCULATING...
- Publication number 20080208473
- Publication date Aug 28, 2008
- Takaaki Kumazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for extracting injustice of component attribute information...
- Publication number 20070061310
- Publication date Mar 15, 2007
- Noriyasu Ninagawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Parts table management system, parts table preparation method and p...
- Publication number 20060053070
- Publication date Mar 9, 2006
- Takaaki Kumazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and apparatus for managing information on chemical substance...
- Publication number 20050071259
- Publication date Mar 31, 2005
- Shinichi Arai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of testing electronic devices
- Publication number 20030197523
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
Method for test conditions
- Publication number 20030199110
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing electronic devices
- Publication number 20030199107
- Publication date Oct 23, 2003
- Hitachi, Ltd
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
System for testing electronic devices
- Publication number 20030199111
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
Photomask for test wafers
- Publication number 20030197522
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING

Takaaki Kumazawa

Person

Patents Grantslast 30 patents

Method and program for selecting product to be inspected

Method for calculating environmental load, program for calculating...

Method for test conditions

Photomask for test wafers

System for testing electronic devices

Method of testing electronic devices indicating short-circuit

Method of testing electronic devices

Patents Applicationslast 30 patents

METHOD AND PROGRAM FOR SELECTING PRODUCT TO BE INSPECTED

METHOD FOR CALCULATING ENVIRONMENTAL LOAD, PROGRAM FOR CALCULATING...

Method for extracting injustice of component attribute information...

Parts table management system, parts table preparation method and p...

System and apparatus for managing information on chemical substance...

Method of testing electronic devices

Method for test conditions

Method of manufacturing electronic devices

System for testing electronic devices

Photomask for test wafers