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Takaaki Shiota
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Thin silicon wafer with high gettering ability and production metho...
Patent number
7,960,253
Issue date
Jun 14, 2011
Sumco Corporation
Takaaki Shiota
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Silicon wafer surface defect evaluation method
Patent number
7,632,349
Issue date
Dec 15, 2009
Sumco Corporation
Wataru Itou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for manufacturing SOI wafer
Patent number
7,615,467
Issue date
Nov 10, 2009
Sumco Corporation
Takaaki Shiota
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for manufacturing SOI wafer
Patent number
7,582,540
Issue date
Sep 1, 2009
Sumco Corporation
Takaaki Shiota
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Silicon wafer and manufacturing method thereof
Patent number
7,122,082
Issue date
Oct 17, 2006
Sumitomo Mitsubishi Silicon Corporation
Takaaki Shiota
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Silicon wafer, and heat treatment method of the same and the heat-t...
Patent number
6,682,597
Issue date
Jan 27, 2004
Mitsubishi Materials Silicon Corporation
Hiroshi Koya
C30 - CRYSTAL GROWTH
Information
Patent Grant
Silicon wafer, and manufacturing method and heat treatment method o...
Patent number
6,663,708
Issue date
Dec 16, 2003
Mitsubishi Materials Silicon Corporation
Etsuro Morita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Silicon wafer, and heat treatment method of the same and the heat-t...
Patent number
6,428,619
Issue date
Aug 6, 2002
Mitsubishi Materials Silicon Corporation
Hiroshi Koya
C30 - CRYSTAL GROWTH
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF PRODUCING SEMICONDUCTOR WAFER
Publication number
20100009521
Publication date
Jan 14, 2010
SUMCO CORPORATION
Takaaki Shiota
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Silicon Wafer and Production Method Thereof
Publication number
20090278239
Publication date
Nov 12, 2009
SUMCO CORPORATION
Takaaki Shiota
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Silicon Wafer Surface Defect Evaluation Method
Publication number
20070044709
Publication date
Mar 1, 2007
Wataru Itou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for manufacturing SOI wafer
Publication number
20060121696
Publication date
Jun 8, 2006
SUMCO CORPORATION
Takaaki Shiota
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for manufacturing SOI wafer
Publication number
20060121692
Publication date
Jun 8, 2006
SUMCO CORPORATION
Takaaki Shiota
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Silicon wafer and manufacturing method thereof
Publication number
20040207048
Publication date
Oct 21, 2004
Sumitomo Mitsubishi Silicon Corporation
Takaaki Shiota
C30 - CRYSTAL GROWTH
Information
Patent Application
Method of manufacturing silicon
Publication number
20040025983
Publication date
Feb 12, 2004
Etsuro Morita
C30 - CRYSTAL GROWTH
Information
Patent Application
Silicon wafer, and heat treatment method of the same and the heat-t...
Publication number
20030051660
Publication date
Mar 20, 2003
Hiroshi Koya
C30 - CRYSTAL GROWTH