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Takafumi Hashitani
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Kawasaki, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Contactor having contact electrodes of metal springs embedded in a...
Patent number
7,403,024
Issue date
Jul 22, 2008
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Anisotropic conductive sheet, production process, contact structure...
Patent number
7,267,559
Issue date
Sep 11, 2007
Fujitsu Limited
Takafumi Hashitani
G01 - MEASURING TESTING
Information
Patent Grant
Contactor having conductive particles in a hole as a contact electrode
Patent number
7,202,679
Issue date
Apr 10, 2007
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Contactor having conductive particles in a hole as a contact electrode
Patent number
7,038,477
Issue date
May 2, 2006
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Contactor having conductive particles in a hole as a contact electrode
Patent number
6,937,038
Issue date
Aug 30, 2005
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Contactor for testing miniaturized devices and components
Patent number
6,927,343
Issue date
Aug 9, 2005
Fujitsu Limited
Naoyuki Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
System and method for assessing environmental load
Patent number
6,889,163
Issue date
May 3, 2005
Fujitsu Limited
Takafumi Hashitani
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Contactor for testing semiconductor device and manufacturing method...
Patent number
6,791,345
Issue date
Sep 14, 2004
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Contactor having conductive particles in a hole as a contact electrode
Patent number
6,545,363
Issue date
Apr 8, 2003
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Biodegradable resin molded article
Patent number
5,744,516
Issue date
Apr 28, 1998
Fujitsu Limited
Takafumi Hashitani
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Biodegradable resin molded article
Patent number
5,545,485
Issue date
Aug 13, 1996
Fujitsu Limited
Takafumi Hashitani
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Small size apparatus for measuring and recording acceleration
Patent number
5,541,860
Issue date
Jul 30, 1996
Fujitsu Limited
Fumio Takei
G01 - MEASURING TESTING
Information
Patent Grant
Process and apparatus for preparation of single crystal of biopolymer
Patent number
5,126,115
Issue date
Jun 30, 1992
Fujitsu Limited
Shozo Fujita
C30 - CRYSTAL GROWTH
Information
Patent Grant
Process and apparatus for preparation of single crystal of biopolymer
Patent number
4,990,216
Issue date
Feb 5, 1991
Fujitsu Limited
Shozo Fujita
C30 - CRYSTAL GROWTH
Patents Applications
last 30 patents
Information
Patent Application
Contactor having conductive particles in a hole as a contact electrode
Publication number
20060119374
Publication date
Jun 8, 2006
FUJITSU LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Application
Contactor having conductive particles in a hole as a contact electrode
Publication number
20050110509
Publication date
May 26, 2005
FUJITSU LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Application
Contactor for testing semiconductor device and manufacturing method...
Publication number
20040266272
Publication date
Dec 30, 2004
FUJITSU LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Application
System and method for assessing environmental load
Publication number
20040039529
Publication date
Feb 26, 2004
FUJITSU LIMITED
Takafumi Hashitani
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Contactor having conductive particles in a hole as a contact electrode
Publication number
20030141884
Publication date
Jul 31, 2003
FUJITSU LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Application
Contactor for testing miniaturized devices and components
Publication number
20030127246
Publication date
Jul 10, 2003
FUJITSU LIMITED
Naoyuki Watanabe
G01 - MEASURING TESTING
Information
Patent Application
Anisotropic conductive sheet, production process, contact structure...
Publication number
20020191406
Publication date
Dec 19, 2002
FUJITSU LIMITED
Takafumi Hashitani
G01 - MEASURING TESTING
Information
Patent Application
Contactor for testing semiconductor device and manufacturing method...
Publication number
20020105347
Publication date
Aug 8, 2002
FUJITSU LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Application
Contactor having conductive particles in a hole as a contact electrode
Publication number
20020013010
Publication date
Jan 31, 2002
FUJITSU LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING