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Takafumi Hiroi
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Tokyo, JP
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last 30 patents
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Patent Grant
Evaluator, measurement apparatus, evaluating method, and non-transi...
Patent number
11,060,918
Issue date
Jul 13, 2021
Ricoh Company, Ltd.
Takuroh Sone
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
EVALUATOR, MEASUREMENT APPARATUS, EVALUATING METHOD, AND NON-TRANSI...
Publication number
20200018650
Publication date
Jan 16, 2020
Takuroh Sone
G01 - MEASURING TESTING