Takafumi Miwa

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device
- Patent number 12,106,930
- Issue date Oct 1, 2024
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,749,494
- Issue date Sep 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,735,394
- Issue date Aug 22, 2023
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,646,172
- Issue date May 9, 2023
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,398,367
- Issue date Jul 26, 2022
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,398,366
- Issue date Jul 26, 2022
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement system and method for setting observation conditions of...
- Patent number 11,380,518
- Issue date Jul 5, 2022
- Hitachi, Ltd.
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,335,535
- Issue date May 17, 2022
- HITACHI HIGH-TECH CORPORATION
- Yohei Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle measuring device and particle measuring method
- Patent number 11,143,606
- Issue date Oct 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Tomihiro Hashizume
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus and charged particle beam inspectio...
- Patent number 11,043,359
- Issue date Jun 22, 2021
- HITACHI HIGH-TECH CORPORATION
- Yohei Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and sample observation method using sc...
- Patent number 11,011,348
- Issue date May 18, 2021
- HITACHI HIGH-TECH CORPORATION
- Daisuke Bizen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,872,742
- Issue date Dec 22, 2020
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 10,134,558
- Issue date Nov 20, 2018
- Hitachi High-Technologies Corporation
- Yasunari Sohda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus for measuring surface potential of...
- Patent number 9,799,486
- Issue date Oct 24, 2017
- Hitachi High-Technologies Corporation
- Seiichiro Kanno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam equipment
- Patent number 9,543,053
- Issue date Jan 10, 2017
- Hitachi High-Technologies Corporation
- Yasunari Sohda
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Electronic microscope, setting method of observation condition of e...
- Patent number 9,236,220
- Issue date Jan 12, 2016
- Hitachi High-Technologies Corporation
- Natsuki Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation specimen for use in electron microscopy, electron micro...
- Patent number 9,202,668
- Issue date Dec 1, 2015
- Hitachi High-Technologies Corporation
- Takafumi Miwa
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope and image capturing method using electron beam
- Patent number 8,907,279
- Issue date Dec 9, 2014
- Hitachi High-Technologies Corporation
- Natsuki Tsuno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION DEVICE
- Publication number 20240346818
- Publication date Oct 17, 2024
- Hitachi, Ltd
- Takafumi MIWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20230005700
- Publication date Jan 5, 2023
- Hitachi High-Tech Corporation
- Takafumi MIWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20220102108
- Publication date Mar 31, 2022
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20220102109
- Publication date Mar 31, 2022
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20220028650
- Publication date Jan 27, 2022
- Hitachi High-Tech Corporation
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measurement System and Method for Setting Observation Conditions of...
- Publication number 20210407763
- Publication date Dec 30, 2021
- Hitachi, Ltd
- Takafumi MIWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210043412
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTICLE BEAM INSPECTIO...
- Publication number 20210043419
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Yohei Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210043413
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210043415
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Yohei Nakamura
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE MEASURING DEVICE AND PARTICLE MEASURING METHOD
- Publication number 20200371050
- Publication date Nov 26, 2020
- Hitachi High-Tech Corporation
- Tomihiro Hashizume
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20200006032
- Publication date Jan 2, 2020
- Hitachi High-Technologies Corporation
- Takafumi MIWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD USING SC...
- Publication number 20190348255
- Publication date Nov 14, 2019
- Hitachi High-Technologies Corporation
- Daisuke BIZEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope
- Publication number 20170018394
- Publication date Jan 19, 2017
- Hitachi High-Technologies Corporation
- Yasunari SOHDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20160013010
- Publication date Jan 14, 2016
- Hitachi High-Technologies Corporation
- Seiichiro KANNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC MICROSCOPE, SETTING METHOD OF OBSERVATION CONDITION OF E...
- Publication number 20150041644
- Publication date Feb 12, 2015
- Hitachi High-Technologies Corporation
- Natsuki Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM EQUIPMENT
- Publication number 20150034836
- Publication date Feb 5, 2015
- Hitachi High-Technologies Corporation
- Yasunari Sohda
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
OBSERVATION SPECIMEN FOR USE IN ELECTRON MICROSCOPY, ELECTRON MICRO...
- Publication number 20140264018
- Publication date Sep 18, 2014
- Hitachi High-Technologies Corporation
- Takafumi Miwa
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE AND IMAGE CAPTURING METHOD USING ELECTRON BEAM
- Publication number 20140097342
- Publication date Apr 10, 2014
- Natsuki Tsuno
- G01 - MEASURING TESTING

Takafumi Miwa

Person

Patents Grantslast 30 patents

Charged particle beam device

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus

Measurement system and method for setting observation conditions of...

Charged particle beam apparatus

Particle measuring device and particle measuring method

Charged particle beam apparatus and charged particle beam inspectio...

Scanning electron microscope and sample observation method using sc...

Charged particle beam device

Scanning electron microscope

Charged particle beam apparatus for measuring surface potential of...

Electron beam equipment

Electronic microscope, setting method of observation condition of e...

Observation specimen for use in electron microscopy, electron micro...

Electron microscope and image capturing method using electron beam

Patents Applicationslast 30 patents

INSPECTION DEVICE

Charged Particle Beam Device

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

Measurement System and Method for Setting Observation Conditions of...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTICLE BEAM INSPECTIO...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

PARTICLE MEASURING DEVICE AND PARTICLE MEASURING METHOD

CHARGED PARTICLE BEAM DEVICE

SCANNING ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD USING SC...

Scanning Electron Microscope

Charged Particle Beam Apparatus

ELECTRONIC MICROSCOPE, SETTING METHOD OF OBSERVATION CONDITION OF E...

ELECTRON BEAM EQUIPMENT

OBSERVATION SPECIMEN FOR USE IN ELECTRON MICROSCOPY, ELECTRON MICRO...

ELECTRON MICROSCOPE AND IMAGE CAPTURING METHOD USING ELECTRON BEAM