Takafumi Morimoto

Person

Chia, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope
- Patent number 8,844,061
- Issue date Sep 23, 2014
- Hitachi, Ltd.
- Shuichi Baba
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 8,342,008
- Issue date Jan 1, 2013
- Hitachi, Ltd.
- Shuichi Baba
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 8,011,230
- Issue date Sep 6, 2011
- Hitachi, Ltd.
- Masahiro Watanabe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 7,631,548
- Issue date Dec 15, 2009
- Hitachi, Ltd.
- Shuichi Baba
- G01 - MEASURING TESTING
Information Patent Grant
Probe manufacturing method, probe, and scanning probe microscope
- Patent number 7,388,199
- Issue date Jun 17, 2008
- Hitachi Kenki Fine Tech Co., Ltd.
- Takafumi Morimoto
- G01 - MEASURING TESTING
Information Patent Grant
Scanning type probe microscope and probe moving control method ther...
- Patent number 7,350,404
- Issue date Apr 1, 2008
- Hitachi Kenki Fine Tech Co., Ltd.
- Tooru Kurenuma
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and measurement method using the same
- Patent number 7,333,191
- Issue date Feb 19, 2008
- Hitachi Kenki FineTech. Co., Ltd.
- Ken Murayama
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring depth of holes formed on a specimen
- Patent number 7,243,441
- Issue date Jul 17, 2007
- Hitachi Kenki Fine Tech Co., Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and method of measurement
- Patent number 6,881,954
- Issue date Apr 19, 2005
- Hitachi Construction Machinery Co., Ltd.
- Takafumi Morimoto
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 6,278,113
- Issue date Aug 21, 2001
- Hitachi Construction Machinery Co, Ltd.
- Ken Murayama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fine movement mechanism unit and scanning probe microscope
- Patent number 6,229,607
- Issue date May 8, 2001
- Hitachi Construction Machinery Co., Ltd.
- Takashi Shirai
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope with the stage unit
- Patent number 6,184,533
- Issue date Feb 6, 2001
- Hitachi Construction Machinery Co., Ltd.
- Takashi Shirai
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and processing apparatus
- Patent number 5,965,881
- Issue date Oct 12, 1999
- Hitachi Construction Machinery Co., Ltd.
- Takafumi Morimoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Home terminal and shopping system
- Patent number 5,870,716
- Issue date Feb 9, 1999
- Hitachi, Ltd.
- Taichi Sugiyama
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
WORK MACHINE
- Publication number 20220413488
- Publication date Dec 29, 2022
- Hitachi Construction Machinery Co., Ltd.
- Takashi SAEGUSA
- E02 - HYDRAULIC ENGINEERING FOUNDATIONS SOIL SHIFTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20140298548
- Publication date Oct 2, 2014
- Shuichi BABA
- B82 - NANO-TECHNOLOGY
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20130205454
- Publication date Aug 8, 2013
- Hitachi, Ltd
- Shuichi BABA
- B82 - NANO-TECHNOLOGY
Information Patent Application
PROBE FOR SCANNING PROBE MICROSCOPE
- Publication number 20100043108
- Publication date Feb 18, 2010
- HITACHI CONSTRUCTION MACHINERY CO., LTD.
- Motoyuki Hirooka
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope
- Publication number 20090158828
- Publication date Jun 25, 2009
- Shuichi BABA
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND MEASUREMENT METHOD OF SAME
- Publication number 20080245139
- Publication date Oct 9, 2008
- Takafumi Morimoto
- G01 - MEASURING TESTING
Information Patent Application
Method of Control of Probe Scan and Apparatus for Controlling Probe...
- Publication number 20080236259
- Publication date Oct 2, 2008
- Tooru Kurenuma
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20080223122
- Publication date Sep 18, 2008
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Application
PROBE CONTROL METHOD FOR SCANNING PROBE MICROSCOPE
- Publication number 20080087820
- Publication date Apr 17, 2008
- Toru KURENUMA
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope
- Publication number 20070266780
- Publication date Nov 22, 2007
- SHUICHI BABA
- G01 - MEASURING TESTING
Information Patent Application
Probe replacement method for scanning probe microscope
- Publication number 20070180889
- Publication date Aug 9, 2007
- Ken Murayama
- G01 - MEASURING TESTING
Information Patent Application
Cantilever and inspecting apparatus
- Publication number 20070051887
- Publication date Mar 8, 2007
- Kishio Hidaka
- G01 - MEASURING TESTING
Information Patent Application
Scanning type probe microscope and probe moving control method ther...
- Publication number 20060284083
- Publication date Dec 21, 2006
- Tooru Kurenuma
- G01 - MEASURING TESTING
Information Patent Application
Probe manufacturing method, probe, and scanning probe microsope
- Publication number 20060284084
- Publication date Dec 21, 2006
- Takafumi Morimoto
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring depth of holes formed on a specimen
- Publication number 20050183282
- Publication date Aug 25, 2005
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope and measurement method using the same
- Publication number 20050012936
- Publication date Jan 20, 2005
- Ken Murayama
- G01 - MEASURING TESTING

Takafumi Morimoto

Person

Patents Grantslast 30 patents

Scanning probe microscope

Scanning probe microscope

Scanning probe microscope

Scanning probe microscope

Probe manufacturing method, probe, and scanning probe microscope

Scanning type probe microscope and probe moving control method ther...

Scanning probe microscope and measurement method using the same

Method and apparatus for measuring depth of holes formed on a specimen

Scanning probe microscope and method of measurement

Scanning probe microscope

Fine movement mechanism unit and scanning probe microscope

Scanning probe microscope with the stage unit

Scanning probe microscope and processing apparatus

Home terminal and shopping system

Patents Applicationslast 30 patents

WORK MACHINE

SCANNING PROBE MICROSCOPE

SCANNING PROBE MICROSCOPE

PROBE FOR SCANNING PROBE MICROSCOPE

Scanning Probe Microscope

SCANNING PROBE MICROSCOPE AND MEASUREMENT METHOD OF SAME

Method of Control of Probe Scan and Apparatus for Controlling Probe...

SCANNING PROBE MICROSCOPE

PROBE CONTROL METHOD FOR SCANNING PROBE MICROSCOPE

Scanning Probe Microscope

Probe replacement method for scanning probe microscope

Cantilever and inspecting apparatus

Scanning type probe microscope and probe moving control method ther...

Probe manufacturing method, probe, and scanning probe microsope

Method and apparatus for measuring depth of holes formed on a specimen

Scanning probe microscope and measurement method using the same