Takafumi Ninomiya

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Shiga, JP

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Patents Grantslast 30 patents

Information Patent Grant
Alignment measurement apparatus and method for using the same in fo...
- Patent number 5,910,036
- Issue date Jun 8, 1999
- NEC Corporation
- Takafumi Ninomiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alignment measurement apparatus and method for using the same in fo...
- Patent number 5,762,528
- Issue date Jun 9, 1998
- NEC Corporation
- Takafumi Ninomiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hole-size measuring system for CRT black matrix layer
- Patent number 5,745,168
- Issue date Apr 28, 1998
- NEC Corporation
- Takafumi Ninomiya
- H04 - ELECTRIC COMMUNICATION TECHNIQUE