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Takafumi Yokino

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  • Hamamatsu-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Spectroscope and spectroscope production method
    • Patent number 11,725,986
    • Issue date Aug 15, 2023
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectral module and method for manufacturing spectral module
    • Patent number 11,493,386
    • Issue date Nov 8, 2022
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroscope
    • Patent number 11,262,240
    • Issue date Mar 1, 2022
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectrometer
    • Patent number D933509
    • Issue date Oct 19, 2021
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer
    • Patent number D933510
    • Issue date Oct 19, 2021
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectroscope and method for producing spectroscope
    • Patent number 11,022,493
    • Issue date Jun 1, 2021
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectrometer
    • Patent number D913826
    • Issue date Mar 23, 2021
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer
    • Patent number D913132
    • Issue date Mar 16, 2021
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer
    • Patent number D911194
    • Issue date Feb 23, 2021
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer
    • Patent number D910471
    • Issue date Feb 16, 2021
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectroscope
    • Patent number 10,883,877
    • Issue date Jan 5, 2021
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroscope
    • Patent number 10,871,397
    • Issue date Dec 22, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G02 - OPTICS
  • Information Patent Grant

    Spectrometer, and spectrometer production method
    • Patent number 10,775,236
    • Issue date Sep 15, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectrometer having a flexible printed circuit
    • Patent number D890005
    • Issue date Jul 14, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer having a flexible printed circuit
    • Patent number D889294
    • Issue date Jul 7, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer having a flexible printed circuit
    • Patent number D885223
    • Issue date May 26, 2020
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer having a flexible printed circuit
    • Patent number D884531
    • Issue date May 19, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer having a flexible printed circuit
    • Patent number D884533
    • Issue date May 19, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer having a flexible printed circuit
    • Patent number D884534
    • Issue date May 19, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer having a flexible printed circuit
    • Patent number D884532
    • Issue date May 19, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer having a flexible printed circuit
    • Patent number D884530
    • Issue date May 19, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer
    • Patent number D883116
    • Issue date May 5, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer
    • Patent number D883117
    • Issue date May 5, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer
    • Patent number D880323
    • Issue date Apr 7, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer
    • Patent number D878226
    • Issue date Mar 17, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Surface-enhanced Raman scattering unit including integrally formed...
    • Patent number 10,551,322
    • Issue date Feb 4, 2020
    • Hamamatsu Photonics K.K.
    • Masashi Ito
    • B82 - NANO-TECHNOLOGY
  • Information Patent Grant

    Spectroscope
    • Patent number 10,539,461
    • Issue date Jan 21, 2020
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroscope and method for producing spectroscope
    • Patent number 10,480,999
    • Issue date Nov 19, 2019
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroscope, and spectroscope production method
    • Patent number 10,408,677
    • Issue date Sep 10, 2019
    • Hamamatsu Photonics K.K.
    • Takafumi Yokino
    • B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
  • Information Patent Grant

    Surface-enhanced Raman scattering element
    • Patent number 10,408,761
    • Issue date Sep 10, 2019
    • Hamamatsu Photonics K.K.
    • Masashi Ito
    • B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents