Takafumi Yotsuji

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron microscope and sample observation method
- Patent number 9,754,762
- Issue date Sep 5, 2017
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 9,754,763
- Issue date Sep 5, 2017
- Hitachi High-Technologies Corporation
- Toshiyuki Oyagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric charged particle beam microscope and microscopy
- Patent number 7,863,564
- Issue date Jan 4, 2011
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of observing a sample by a transmission electron microscope
- Patent number 6,777,679
- Issue date Aug 17, 2004
- Hitachi High-Technologies Corporation
- Isao Nagaoki
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number 6,472,663
- Issue date Oct 29, 2002
- Hitachi, Ltd.
- Isao Nagaoki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, ELECTRON MICROSCOPE AND SAMPLE OBS...
- Publication number 20170323762
- Publication date Nov 9, 2017
- Hitachi High-Technologies Corporation
- Toshiyuki OOYAGI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD
- Publication number 20170133195
- Publication date May 11, 2017
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope
- Publication number 20160203943
- Publication date Jul 14, 2016
- Hitachi High-Technologies Corporation
- Toshiyuki OYAGI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE, AND METHOD FOR ADJUSTNG OPTICAL AXIS OF ELECTR...
- Publication number 20130062519
- Publication date Mar 14, 2013
- Toshiyuki Oyagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM MICROSCOPE AND MEASURING METHOD USING SAME
- Publication number 20120104253
- Publication date May 3, 2012
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRIC CHARGED PARTICLE BEAM MICROSCOPE AND MICROSCOPY
- Publication number 20090127474
- Publication date May 21, 2009
- Ruriko TSUNETA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of observing a sample by a transmission electron microscope
- Publication number 20030183762
- Publication date Oct 2, 2003
- Isao Nagaoki
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20020033451
- Publication date Mar 21, 2002
- ISAO NAGAOKI
- G01 - MEASURING TESTING

Takafumi Yotsuji

Person

Patents Grantslast 30 patents

Electron microscope and sample observation method

Electron microscope

Electric charged particle beam microscope and microscopy

Method of observing a sample by a transmission electron microscope

Electron microscope

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM APPARATUS, ELECTRON MICROSCOPE AND SAMPLE OBS...

ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD

Electron Microscope

ELECTRON MICROSCOPE, AND METHOD FOR ADJUSTNG OPTICAL AXIS OF ELECTR...

CHARGED PARTICLE BEAM MICROSCOPE AND MEASURING METHOD USING SAME

ELECTRIC CHARGED PARTICLE BEAM MICROSCOPE AND MICROSCOPY

Method of observing a sample by a transmission electron microscope

ELECTRON MICROSCOPE