Takaharu Nakamura

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Degradation diagnostic device and air-conditioning apparatus
- Patent number 11,619,224
- Issue date Apr 4, 2023
- Mitsubishi Electric Corporation
- Takaharu Nakamura
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Semiconductor memory device and manufacturing method for semiconduc...
- Patent number 7,776,691
- Issue date Aug 17, 2010
- Oki Semiconductor Co., Ltd.
- Takaharu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device and manufacturing method for semiconduc...
- Patent number 7,462,896
- Issue date Dec 9, 2008
- Oki Electric Industry Co., Ltd.
- Takaharu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
BIMOS transistor devices having bipolar and MOS transistors formed...
- Patent number 5,166,082
- Issue date Nov 24, 1992
- Oki Electric Industry Co., Ltd.
- Takaharu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
FAILURE SYMPTOM DETECTION DEVICE AND FAILURE SYMPTOM DETECTION METH...
- Publication number 20240283332
- Publication date Aug 22, 2024
- Mitsubishi Electric Corporation
- Ken HIRAKIDA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
ABNORMALITY DIAGNOSIS DEVICE AND ABNORMALITY DIAGNOSIS METHOD
- Publication number 20240120870
- Publication date Apr 11, 2024
- Mitsubishi Electric Corporation
- Hiroshi INOUE
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
DEGRADATION DIAGNOSIS DEVICE AND AIR-CONDITIONING DEVICE
- Publication number 20200049364
- Publication date Feb 13, 2020
- Mitsubishi Electric Corporation
- Takaharu NAKAMURA
- F24 - HEATING RANGES VENTILATING
Information Patent Application
DEGRADATION DIAGNOSTIC DEVICE AND AIR-CONDITIONING APPARATUS
- Publication number 20190242375
- Publication date Aug 8, 2019
- Mitsubishi Electric Corporation
- Takaharu NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor memory device and manufacturing method for semiconduc...
- Publication number 20090053868
- Publication date Feb 26, 2009
- Oki Electric Industry Co., Ltd.
- Takaharu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor memory device and manufacturing method for semiconduc...
- Publication number 20070023824
- Publication date Feb 1, 2007
- Takaharu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS

Takaharu Nakamura

Person

Patents Grantslast 30 patents

Degradation diagnostic device and air-conditioning apparatus

Semiconductor memory device and manufacturing method for semiconduc...

Semiconductor memory device and manufacturing method for semiconduc...

BIMOS transistor devices having bipolar and MOS transistors formed...

Patents Applicationslast 30 patents

FAILURE SYMPTOM DETECTION DEVICE AND FAILURE SYMPTOM DETECTION METH...

ABNORMALITY DIAGNOSIS DEVICE AND ABNORMALITY DIAGNOSIS METHOD

DEGRADATION DIAGNOSIS DEVICE AND AIR-CONDITIONING DEVICE

DEGRADATION DIAGNOSTIC DEVICE AND AIR-CONDITIONING APPARATUS

Semiconductor memory device and manufacturing method for semiconduc...

Semiconductor memory device and manufacturing method for semiconduc...