Takahide HATAHORI

Person

Osaka-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 12,360,052
- Issue date Jul 15, 2025
- Shimadzu Corporation
- Takahide Hatahori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Joined body testing method, joined body testing device, and joined...
- Patent number 12,320,781
- Issue date Jun 3, 2025
- Kobe Steel, Ltd.
- Ryusuke Hioki
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 12,188,769
- Issue date Jan 7, 2025
- Shimadzu Corporation
- Koki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Vibration measurement device
- Patent number 12,111,266
- Issue date Oct 8, 2024
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection device and defect detection method
- Patent number 12,099,000
- Issue date Sep 24, 2024
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for examining clinched portion of tubular body
- Patent number 11,982,641
- Issue date May 14, 2024
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Displacement measurement device and defect detection device
- Patent number 11,977,032
- Issue date May 7, 2024
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 11,815,493
- Issue date Nov 14, 2023
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 11,790,513
- Issue date Oct 17, 2023
- Shimadzu Corporation
- Koki Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interference image imaging apparatus
- Patent number 11,774,746
- Issue date Oct 3, 2023
- Shimadzu Corporation
- Takahide Hatahori
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Defect detection device
- Patent number 11,391,700
- Issue date Jul 19, 2022
- Samsung Electronics Co., Ltd.
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus
- Patent number 11,226,294
- Issue date Jan 18, 2022
- Shimadzu Corporation
- Takahide Hatahori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect detection method and device
- Patent number 11,193,887
- Issue date Dec 7, 2021
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,181,510
- Issue date Nov 23, 2021
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and method
- Patent number 10,942,152
- Issue date Mar 9, 2021
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection method and defect detection device
- Patent number 10,429,172
- Issue date Oct 1, 2019
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Vibration measurement device
- Patent number 10,317,190
- Issue date Jun 11, 2019
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Flow cell
- Patent number 10,288,550
- Issue date May 14, 2019
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection method and defect detection apparatus
- Patent number 10,267,618
- Issue date Apr 23, 2019
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Raman spectroscopic analyzer
- Patent number 9,551,617
- Issue date Jan 24, 2017
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20240230601
- Publication date Jul 11, 2024
- Shimadzu Corporation
- Hiroshi HORIKAWA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS
- Publication number 20230401688
- Publication date Dec 14, 2023
- Shimadzu Corporation
- Naoto MISHINA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD
- Publication number 20230304787
- Publication date Sep 28, 2023
- Shimadzu Corporation
- Tomotaka NAGASHIMA
- G01 - MEASURING TESTING
Information Patent Application
JOINED BODY TESTING METHOD, JOINED BODY TESTING DEVICE, AND JOINED...
- Publication number 20230266275
- Publication date Aug 24, 2023
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Ryusuke HIOKI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD
- Publication number 20230236111
- Publication date Jul 27, 2023
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM, IMAGE PROCESSING METHOD, AND DEFECT INSPECTION D...
- Publication number 20230114484
- Publication date Apr 13, 2023
- Shimadzu Corporation
- Tomotaka NAGASHIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Inspection Apparatus and Defect Inspection Method
- Publication number 20230085940
- Publication date Mar 23, 2023
- Shimadzu Corporation
- Takahide HATAHORI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20230062821
- Publication date Mar 2, 2023
- Shimadzu Corporation
- Koki YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR EXAMINING CLINCHED PORTION OF TUBULAR BODY
- Publication number 20220229020
- Publication date Jul 21, 2022
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20220180500
- Publication date Jun 9, 2022
- Shimadzu Corporation
- Koki YOSHIDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERFERENCE IMAGE IMAGING APPARATUS
- Publication number 20220179196
- Publication date Jun 9, 2022
- Shimadzu Corporation
- Takahide HATAHORI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20220051390
- Publication date Feb 17, 2022
- Shimadzu Corporation
- Koki YOSHIDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISPLACEMENT MEASUREMENT DEVICE AND DEFECT DETECTION DEVICE
- Publication number 20220034822
- Publication date Feb 3, 2022
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20220026396
- Publication date Jan 27, 2022
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION DEVICE
- Publication number 20210270777
- Publication date Sep 2, 2021
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION METHOD AND DEVICE
- Publication number 20210164897
- Publication date Jun 3, 2021
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
VIBRATION MEASUREMENT DEVICE
- Publication number 20210096085
- Publication date Apr 1, 2021
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS
- Publication number 20210080399
- Publication date Mar 18, 2021
- Shimadzu Corporation
- Takahide HATAHORI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20200191751
- Publication date Jun 18, 2020
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
SOUND-WAVE-PROPAGATION VISUALIZATION DEVICE AND METHOD
- Publication number 20190204275
- Publication date Jul 4, 2019
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE
- Publication number 20180356205
- Publication date Dec 13, 2018
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
VIBRATION MEASUREMENT DEVICE
- Publication number 20180283847
- Publication date Oct 4, 2018
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION METHOD AND DEFECT DETECTION APPARATUS
- Publication number 20170350690
- Publication date Dec 7, 2017
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
RAMAN SPECTROSCOPIC ANALYZER
- Publication number 20160146668
- Publication date May 26, 2016
- SHIMADZU CORPORATION
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
FLOW CELL
- Publication number 20140063494
- Publication date Mar 6, 2014
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
FLOW CELL
- Publication number 20140055782
- Publication date Feb 27, 2014
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING

Takahide HATAHORI

Person

Patents Grantslast 30 patents

Defect inspection apparatus and defect inspection method

Joined body testing method, joined body testing device, and joined...

Defect inspection device and defect inspection method

Vibration measurement device

Defect detection device and defect detection method

Method and device for examining clinched portion of tubular body

Displacement measurement device and defect detection device

Defect inspection apparatus and defect inspection method

Defect inspection apparatus and defect inspection method

Interference image imaging apparatus

Defect detection device

Defect inspection apparatus

Defect detection method and device

Inspection apparatus and inspection method

Defect inspection device and method

Defect detection method and defect detection device

Vibration measurement device

Flow cell

Defect detection method and defect detection apparatus

Raman spectroscopic analyzer

Patents Applicationslast 30 patents

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

DEFECT INSPECTION APPARATUS

DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD

JOINED BODY TESTING METHOD, JOINED BODY TESTING DEVICE, AND JOINED...

DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD

INSPECTION SYSTEM, IMAGE PROCESSING METHOD, AND DEFECT INSPECTION D...

Defect Inspection Apparatus and Defect Inspection Method

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

METHOD AND DEVICE FOR EXAMINING CLINCHED PORTION OF TUBULAR BODY

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

INTERFERENCE IMAGE IMAGING APPARATUS

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

DISPLACEMENT MEASUREMENT DEVICE AND DEFECT DETECTION DEVICE

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

DEFECT DETECTION DEVICE

DEFECT DETECTION METHOD AND DEVICE

VIBRATION MEASUREMENT DEVICE

DEFECT INSPECTION APPARATUS

INSPECTION APPARATUS AND INSPECTION METHOD

SOUND-WAVE-PROPAGATION VISUALIZATION DEVICE AND METHOD

DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE

VIBRATION MEASUREMENT DEVICE

DEFECT DETECTION METHOD AND DEFECT DETECTION APPARATUS

RAMAN SPECTROSCOPIC ANALYZER

FLOW CELL

FLOW CELL