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Takahide Ishikawa
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for evaluating piezoelectric fields
Patent number
6,998,615
Issue date
Feb 14, 2006
Mitsubishi Denki Kabushiki Kaisha
Hideo Takeuchi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for evaluating and adjusting microwave integra...
Patent number
6,911,837
Issue date
Jun 28, 2005
Mitsubishi Denki Kabushiki Kaisha
Takahide Ishikawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Piezoelectric thin film device
Patent number
6,271,619
Issue date
Aug 7, 2001
Mitsubishi Denki Kabushiki Kaisha
Akira Yamada
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Microwave semiconductor integrated circuit
Patent number
5,932,926
Issue date
Aug 3, 1999
Mitsubishi Denki Kabushiki Kaisha
Takaya Maruyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Capacitor
Patent number
5,812,364
Issue date
Sep 22, 1998
Mitsubishi Denki Kabushiki Kaisha
Tomoki Oku
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Transmission lines and fabricating method thereof
Patent number
5,652,557
Issue date
Jul 29, 1997
Mitsubishi Denki Kabushiki Kaisha
Takahide Ishikawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of producing a field effect transistor
Patent number
5,434,094
Issue date
Jul 18, 1995
Mitsubishi Denki Kabushiki Kaisha
Michihiro Kobiki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wiring forming method, wiring restoring method and wiring pattern c...
Patent number
5,429,994
Issue date
Jul 4, 1995
Mitsubishi Denki Kabushiki Kaisha
Takahide Ishikawa
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Field effect transistor device with contact in groove
Patent number
5,324,981
Issue date
Jun 28, 1994
Mitsubishi Denki Kabushiki Kaisha
Michihiro Kobiki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for producing semiconductor device
Patent number
5,302,554
Issue date
Apr 12, 1994
Mitsubishi Denki Kabushiki Kaisha
Takuo Kashiwa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for producing semiconductor chips
Patent number
5,275,958
Issue date
Jan 4, 1994
Mitsubishi Denki Kabushiki Kaisha
Takahide Ishikawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of fabricating gate electrode in recess
Patent number
5,270,228
Issue date
Dec 14, 1993
Mitsubishi Denki Kabushiki Kaisha
Takahide Ishikawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for producing a compound semiconductor MIS FET
Patent number
5,177,026
Issue date
Jan 5, 1993
Mitsubishi Denki Kabushiki Kaisha
Takahide Ishikawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Microwave monolithic integrated circuit with heat radiating electrode
Patent number
5,045,503
Issue date
Sep 3, 1991
Mitsubishi Denki Kabushiki Kaisha
Michihiro Kobiki
C03 - GLASS MINERAL OR SLAG WOOL
Information
Patent Grant
Method of producing an MMIC and the integrated circuit produced the...
Patent number
4,990,973
Issue date
Feb 5, 1991
Mitsubishi Denki Kabushiki Kaisha
Takahide Ishikawa
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Microwave monolithic integrated circuit with heat radiating electrode
Patent number
4,956,697
Issue date
Sep 11, 1990
Mitsubishi Denki Kabushiki Kaisha
Michihiro Kobiki
C03 - GLASS MINERAL OR SLAG WOOL
Information
Patent Grant
Method of producing an MMIC
Patent number
4,921,814
Issue date
May 1, 1990
Mitsubishi Denki Kabushiki Kaisha
Takahide Ishikawa
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR EVALUATING AND ADJUSTING MICROWAVE INTEGRA...
Publication number
20050046435
Publication date
Mar 3, 2005
Mitsubishi Denki Kabushiki Kaisha
Takahide Ishikawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for evaluating piezoelectric fields
Publication number
20040155194
Publication date
Aug 12, 2004
Mitsubishi Denki Kabushiki Kaisha
Hideo Takeuchi
G01 - MEASURING TESTING