Takahiko Arakawa

Person

Itami, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit and method of fabricating same and...
- Patent number 5,612,553
- Issue date Mar 18, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Takahiko Arakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device and method of fabricating same
- Patent number 5,471,095
- Issue date Nov 28, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Isamu Kaminaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device having gate array
- Patent number 5,291,043
- Issue date Mar 1, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Takahiko Arakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device having input/output buffer...
- Patent number 4,992,845
- Issue date Feb 12, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Takahiko Arakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inverter circuit
- Patent number 4,916,385
- Issue date Apr 10, 1990
- Mitsubishi Denki Kkabushiki Kaisha
- Ichiro Tomioka
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor intergrated circuit device
- Patent number 4,870,345
- Issue date Sep 26, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Ichiro Tomioka
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit apparatus
- Patent number 4,856,002
- Issue date Aug 8, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Kazuhiro Sakashita
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit
- Patent number 4,853,757
- Issue date Aug 1, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Yoichi Kuramitsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 4,825,273
- Issue date Apr 25, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Takahiko Arakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device having rest function
- Patent number 4,780,666
- Issue date Oct 25, 1988
- Mitsubishi Denki Kabushiki Kaisha
- Kazuhiro Sakashita
- G01 - MEASURING TESTING

Takahiko Arakawa

Person

Patents Grantslast 30 patents

Semiconductor integrated circuit and method of fabricating same and...

Semiconductor integrated circuit device and method of fabricating same

Semiconductor integrated circuit device having gate array

Semiconductor integrated circuit device having input/output buffer...

Inverter circuit

Semiconductor intergrated circuit device

Semiconductor integrated circuit apparatus

Semiconductor integrated circuit

Semiconductor integrated circuit device

Semiconductor integrated circuit device having rest function