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Takahiko KAKEMIZU
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Microscope and image pasting method
Patent number
10,163,240
Issue date
Dec 25, 2018
Olympus Corporation
Takahiko Kakemizu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Magnifying observation apparatus, and image display method and micr...
Patent number
9,400,379
Issue date
Jul 26, 2016
Olympus Corporation
Takahiko Kakemizu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Microscope system and microscope frame
Patent number
9,389,407
Issue date
Jul 12, 2016
Olympus Corporation
Madoka Ito
G02 - OPTICS
Information
Patent Grant
Material measures for use in evaluating performance of measuring in...
Patent number
8,539,814
Issue date
Sep 24, 2013
Olympus Corporation
Takahiko Kakemizu
G01 - MEASURING TESTING
Information
Patent Grant
Compound scanning probe microscope
Patent number
7,170,048
Issue date
Jan 30, 2007
Olympus Corporation
Takahiko Kakemizu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MICROSCOPE AND IMAGE PASTING METHOD
Publication number
20170161930
Publication date
Jun 8, 2017
OLYMPUS CORPORATION
Takahiko KAKEMIZU
G02 - OPTICS
Information
Patent Application
MICROSCOPE SYSTEM AND MICROSCOPE FRAME
Publication number
20130076887
Publication date
Mar 28, 2013
OLYMPUS CORPORATION
Madoka ITO
G02 - OPTICS
Information
Patent Application
MAGNIFYING OBSERVATION APPARATUS, AND IMAGE DISPLAY METHOD AND MICR...
Publication number
20130070075
Publication date
Mar 21, 2013
OLYMPUS CORPORATION
Takahiko KAKEMIZU
G02 - OPTICS
Information
Patent Application
MATERIAL MEASURES FOR USE IN EVALUATING PERFORMANCE OF MEASURING IN...
Publication number
20110041593
Publication date
Feb 24, 2011
OLYMPUS CORPORATION
Takahiko KAKEMIZU
G01 - MEASURING TESTING
Information
Patent Application
Compound scanning probe microscope
Publication number
20050269495
Publication date
Dec 8, 2005
OLYMPUS CORPORATION
Takahiko Kakemizu
G02 - OPTICS