Takahiko Oshige

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Solar reflector plate
- Patent number 9,594,191
- Issue date Mar 14, 2017
- JFE Steel Corporation
- Kazumichi Sashi
- G02 - OPTICS
Information Patent Grant
Solar light reflecting plate and light collecting/heat collecting d...
- Patent number 9,234,680
- Issue date Jan 12, 2016
- JFE Steel Corporation
- Kazumichi Sashi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for marking defect and device therefor
- Patent number 7,599,052
- Issue date Oct 6, 2009
- NKK Corporation
- Mitsuaki Uesugi
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Grant
Method for marking defect and device therefor
- Patent number 7,423,744
- Issue date Sep 9, 2008
- NKK Corporation
- Mitsuaki Uesugi
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Grant
Method for marking defect and device therefor
- Patent number 7,248,366
- Issue date Jul 24, 2007
- NKK Corporation
- Mitsuaki Uesugi
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Grant
Method and apparatus for detecting surface flaws
- Patent number 5,835,220
- Issue date Nov 10, 1998
- NKK Corporation
- Akira Kazama
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometer and method of controlling coating thickness therewith
- Patent number 5,438,415
- Issue date Aug 1, 1995
- NKK Corporation
- Akira Kazama
- G01 - MEASURING TESTING
Information Patent Grant
Measuring method for ellipsometric parameter and ellipsometer
- Patent number 5,335,066
- Issue date Aug 2, 1994
- NKK Corporation
- Takeo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Measuring method for ellipsometric parameter and ellipsometer
- Patent number 5,311,285
- Issue date May 10, 1994
- NKK Corporation
- Takahiko Oshige
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SOLAR REFLECTOR PLATE
- Publication number 20150109696
- Publication date Apr 23, 2015
- JFE STEEL CORPORATION
- Kazumichi Sashi
- G02 - OPTICS
Information Patent Application
SOLAR LIGHT REFLECTING PLATE AND LIGHT COLLECTING/HEAT COLLECTING D...
- Publication number 20140209091
- Publication date Jul 31, 2014
- JFE STEEL CORPORATION
- Kazumichi Sashi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method for marking defect and device therefor
- Publication number 20090086209
- Publication date Apr 2, 2009
- NKK Corporation
- Mitsuaki Uesugi
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Application
Method for marking defect and device therefor
- Publication number 20070052964
- Publication date Mar 8, 2007
- NKK Corporation
- Mitsuaki Uesugi
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Application
Method for marking defect and device therefor
- Publication number 20020154308
- Publication date Oct 24, 2002
- NKK Corporation, a Japanese Corporation
- Mitsuaki Uesugi
- G01 - MEASURING TESTING

Takahiko Oshige

Person

Patents Grantslast 30 patents

Solar reflector plate

Solar light reflecting plate and light collecting/heat collecting d...

Method for marking defect and device therefor

Method for marking defect and device therefor

Method for marking defect and device therefor

Method and apparatus for detecting surface flaws

Ellipsometer and method of controlling coating thickness therewith

Measuring method for ellipsometric parameter and ellipsometer

Measuring method for ellipsometric parameter and ellipsometer

Patents Applicationslast 30 patents

SOLAR REFLECTOR PLATE

SOLAR LIGHT REFLECTING PLATE AND LIGHT COLLECTING/HEAT COLLECTING D...

Method for marking defect and device therefor

Method for marking defect and device therefor

Method for marking defect and device therefor